Electrothermal noise analysis in frequency tuning of nanoresonators

Seong Chan Jun, Hyungbin Son, C. W. Baik, J. M. Kim, S. W. Moon, H. Jin Kim, X. M.H. Huang, J. Hone

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Electrothermal tuning mechanisms for nanoelectromechanical resonators are demonstrated. Voltages induced by oscillation of Al/SiC nanoresonators around 10 MHz in a moderate magnetic field are measured using a room-temperature tabletop setup in moderate vacuum. The dynamic range as well as the resonance frequency of the resonator can be reversibly controlled by electrothermal tuning using DC voltage. This paper presents experimental results that demonstrates the effect of the resonance frequency, Q factor and dynamic range during the electrothermal tuning process. As the input DC power increases, Q factor decreases due to the decrease in the resonance frequency, and SNR decreases due to the reduced amplitude and increased noise. This can be explained by thermal relaxation of the resonator structure during the tuning process, and Johnson noise and eddy current effects associated with the magnetomotive transduction.

Original languageEnglish
Pages (from-to)1388-1393
Number of pages6
JournalSolid-State Electronics
Volume52
Issue number9
DOIs
Publication statusPublished - 2008 Sep 1

Fingerprint

Tuning
tuning
Resonators
resonators
dynamic range
Q factors
direct current
Electric potential
electric potential
Eddy currents
eddy currents
Vacuum
Magnetic fields
vacuum
oscillations
room temperature
magnetic fields
Temperature

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Cite this

Jun, S. C., Son, H., Baik, C. W., Kim, J. M., Moon, S. W., Kim, H. J., ... Hone, J. (2008). Electrothermal noise analysis in frequency tuning of nanoresonators. Solid-State Electronics, 52(9), 1388-1393. https://doi.org/10.1016/j.sse.2008.04.033
Jun, Seong Chan ; Son, Hyungbin ; Baik, C. W. ; Kim, J. M. ; Moon, S. W. ; Kim, H. Jin ; Huang, X. M.H. ; Hone, J. / Electrothermal noise analysis in frequency tuning of nanoresonators. In: Solid-State Electronics. 2008 ; Vol. 52, No. 9. pp. 1388-1393.
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Jun, SC, Son, H, Baik, CW, Kim, JM, Moon, SW, Kim, HJ, Huang, XMH & Hone, J 2008, 'Electrothermal noise analysis in frequency tuning of nanoresonators', Solid-State Electronics, vol. 52, no. 9, pp. 1388-1393. https://doi.org/10.1016/j.sse.2008.04.033

Electrothermal noise analysis in frequency tuning of nanoresonators. / Jun, Seong Chan; Son, Hyungbin; Baik, C. W.; Kim, J. M.; Moon, S. W.; Kim, H. Jin; Huang, X. M.H.; Hone, J.

In: Solid-State Electronics, Vol. 52, No. 9, 01.09.2008, p. 1388-1393.

Research output: Contribution to journalArticle

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AU - Jun, Seong Chan

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AU - Baik, C. W.

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