Elliptic solid immersion lens for NFR; compensation for disk thickness variation and disk tilt

Tae Sun Song, Hyuck Dong Kwon, No Cheol Park, Young Pil Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

In the last decade of optical data storage development, near-field recording (NFR) technology has been suggested for achieving higher areal density. However, there remain several serious and practical issues. The major defects in NFR due to the use of a solid immersion lens (SIL) are dust and thermal problems compared to orthodox optical storage technologies. The existing SIL is delicate in an unsealed environment due to heat, dust, contamination etc. CISD released a new SIL concept called elliptic solid immersion lens (ESIL) at the last ISOM (T.S. Song et al, ISOM01 p. 130, 2001). The new ESIL is capable of resolving some critical problems that are possibly caused by the existing SIL which records on the disk surface; in addition, the ESIL does not require an objective lens and with its simple structure, it has achieved improvements in mechanical tolerances of the alignment process and in pickup actuator dynamics. Although the ESIL possesses the potential to reduce present restrictions from the conventional SIL, it is necessary to establish a focusing servo system against variation in thickness of the cover layer. Also, a gap maintenance and tilt compensation system using an optical sensor and PZT was proposed in this paper.

Original languageEnglish
Title of host publication2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages210-212
Number of pages3
ISBN (Electronic)0780373790, 9780780373792
DOIs
Publication statusPublished - 2002 Jan 1
EventInternational Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002 - Waikoloa, United States
Duration: 2002 Jul 72002 Jul 11

Publication series

Name2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest

Other

OtherInternational Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002
CountryUnited States
CityWaikoloa
Period02/7/702/7/11

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All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electronic, Optical and Magnetic Materials

Cite this

Song, T. S., Kwon, H. D., Park, N. C., & Park, Y. P. (2002). Elliptic solid immersion lens for NFR; compensation for disk thickness variation and disk tilt. In 2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest (pp. 210-212). [1028618] (2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/OMODS.2002.1028618