Enabling closed-loop neural interface: A bi-directional interface circuit with stimulation artifact cancellation and cross-channel CM noise suppression

Adam E. Mendrela, Jihyun Cho, Jeffrey A. Fredenburg, Cynthia A. Chestek, Michael P. Flynn, Euisik Yoon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

We present the first bi-directional neural interface chip that employs a stimulation artifact cancellation circuit to allow concurrent recording and stimulation. In order to further suppress cross-channel common-mode noise, we incorporated a novel common average referencing (CAR) circuit in conjunction with range-adapting (RA) SAR ADC for low-power implementation. The fabricated prototype attenuates stimulation artifacts by up to 42 dB and suppresses common noise among channels by up to 39.8 dB at 330 nW and in an area of 0.17 mm2 per channel.

Original languageEnglish
Title of host publication2015 Symposium on VLSI Circuits, VLSI Circuits 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
PagesC108-C109
ISBN (Electronic)9784863485020
DOIs
Publication statusPublished - 2015 Aug 31
Event29th Annual Symposium on VLSI Circuits, VLSI Circuits 2015 - Kyoto, Japan
Duration: 2015 Jun 172015 Jun 19

Publication series

NameIEEE Symposium on VLSI Circuits, Digest of Technical Papers
Volume2015-August

Conference

Conference29th Annual Symposium on VLSI Circuits, VLSI Circuits 2015
CountryJapan
CityKyoto
Period15/6/1715/6/19

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Mendrela, A. E., Cho, J., Fredenburg, J. A., Chestek, C. A., Flynn, M. P., & Yoon, E. (2015). Enabling closed-loop neural interface: A bi-directional interface circuit with stimulation artifact cancellation and cross-channel CM noise suppression. In 2015 Symposium on VLSI Circuits, VLSI Circuits 2015 (pp. C108-C109). [7231342] (IEEE Symposium on VLSI Circuits, Digest of Technical Papers; Vol. 2015-August). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VLSIC.2015.7231342