Energy level alignment of C60/Co using x-ray and UV photoelectron spectroscopy

J. H. Seo, S. J. Kang, C. Y. Kim, K. H. Yoo, C. N. Whang

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The energy level alignment at the interface between fullerene (C 60) and Co has been determined by x-ray and ultraviolet photoelectron spectroscopy. To investigate the interfacial electronic structure, a C 60 layer was deposited on a clean Co surface in a stepwise manner. The measured onset of the highest occupied molecular orbital energy level was at 1.54eV from the Fermi level of Co. The vacuum level was shifted 0.41eV toward lower binding energy with the additional C60 layers, which means that an interface dipole exists at the interface between C60 and Co. The C 1s spectra show that band bending occurs at the interface between C 60 and Co. These results indicate that the barrier height of the hole injection from Co to C60 is 1.14eV, which is a smaller value than that for electron injection (1.46eV).

Original languageEnglish
Article numberS21
Pages (from-to)S2055-S2060
JournalJournal of Physics Condensed Matter
Volume18
Issue number33
DOIs
Publication statusPublished - 2006 Aug 23

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Energy level alignment of C<sub>60</sub>/Co using x-ray and UV photoelectron spectroscopy'. Together they form a unique fingerprint.

  • Cite this