Energy Relaxation Dynamics of Photoexcited Ceo Solid

Sung Ik Yang, Yung Doug Suh, Seung Min Jin, Seong Keun Kim, Jeunghee Park, Eun Joo Shin, Dongho Kim

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

The time-resolved photoluminescence (PL) of C60 solid film was measured at various detection wavelengths, excitation laser fluences, and temperatures. Two emission bands were identified which possess different decay profiles, and these profiles exhibited completely opposite temperature dependence. The bands were attributed to free exciton states and self-trapped exciton states, which decay through diffusive recombination and activated intersystem crossing, respectively. For the latter case, a distinct rise component in the PL time profile was observed at low temperature. This strongly suggests that there exists a nonnegligible barrier between the free exciton states and self-trapped exciton states.

Original languageEnglish
Pages (from-to)9223-9226
Number of pages4
JournalJournal of Physical Chemistry
Volume100
Issue number22
Publication statusPublished - 1996 Dec 1

Fingerprint

Excitons
excitons
Photoluminescence
profiles
photoluminescence
Laser excitation
energy
decay
Temperature
fluence
Wavelength
temperature dependence
LDS 751
wavelengths
excitation
lasers
temperature

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physical and Theoretical Chemistry

Cite this

Yang, S. I., Suh, Y. D., Jin, S. M., Kim, S. K., Park, J., Shin, E. J., & Kim, D. (1996). Energy Relaxation Dynamics of Photoexcited Ceo Solid. Journal of Physical Chemistry, 100(22), 9223-9226.
Yang, Sung Ik ; Suh, Yung Doug ; Jin, Seung Min ; Kim, Seong Keun ; Park, Jeunghee ; Shin, Eun Joo ; Kim, Dongho. / Energy Relaxation Dynamics of Photoexcited Ceo Solid. In: Journal of Physical Chemistry. 1996 ; Vol. 100, No. 22. pp. 9223-9226.
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Yang, SI, Suh, YD, Jin, SM, Kim, SK, Park, J, Shin, EJ & Kim, D 1996, 'Energy Relaxation Dynamics of Photoexcited Ceo Solid', Journal of Physical Chemistry, vol. 100, no. 22, pp. 9223-9226.

Energy Relaxation Dynamics of Photoexcited Ceo Solid. / Yang, Sung Ik; Suh, Yung Doug; Jin, Seung Min; Kim, Seong Keun; Park, Jeunghee; Shin, Eun Joo; Kim, Dongho.

In: Journal of Physical Chemistry, Vol. 100, No. 22, 01.12.1996, p. 9223-9226.

Research output: Contribution to journalArticle

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AU - Yang, Sung Ik

AU - Suh, Yung Doug

AU - Jin, Seung Min

AU - Kim, Seong Keun

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AU - Shin, Eun Joo

AU - Kim, Dongho

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AB - The time-resolved photoluminescence (PL) of C60 solid film was measured at various detection wavelengths, excitation laser fluences, and temperatures. Two emission bands were identified which possess different decay profiles, and these profiles exhibited completely opposite temperature dependence. The bands were attributed to free exciton states and self-trapped exciton states, which decay through diffusive recombination and activated intersystem crossing, respectively. For the latter case, a distinct rise component in the PL time profile was observed at low temperature. This strongly suggests that there exists a nonnegligible barrier between the free exciton states and self-trapped exciton states.

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Yang SI, Suh YD, Jin SM, Kim SK, Park J, Shin EJ et al. Energy Relaxation Dynamics of Photoexcited Ceo Solid. Journal of Physical Chemistry. 1996 Dec 1;100(22):9223-9226.