Energy Relaxation Dynamics of Photoexcited Ceo Solid

Sung Ik Yang, Yung Doug Suh, Seung Min Jin, Seong Keun Kim, Jeunghee Park, Eun Joo Shin, Dongho Kim

Research output: Contribution to journalArticle

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Abstract

The time-resolved photoluminescence (PL) of C60 solid film was measured at various detection wavelengths, excitation laser fluences, and temperatures. Two emission bands were identified which possess different decay profiles, and these profiles exhibited completely opposite temperature dependence. The bands were attributed to free exciton states and self-trapped exciton states, which decay through diffusive recombination and activated intersystem crossing, respectively. For the latter case, a distinct rise component in the PL time profile was observed at low temperature. This strongly suggests that there exists a nonnegligible barrier between the free exciton states and self-trapped exciton states.

Original languageEnglish
Pages (from-to)9223-9226
Number of pages4
JournalJournal of physical chemistry
Volume100
Issue number22
DOIs
Publication statusPublished - 1996 Jan 1

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physical and Theoretical Chemistry

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    Yang, S. I., Suh, Y. D., Jin, S. M., Kim, S. K., Park, J., Shin, E. J., & Kim, D. (1996). Energy Relaxation Dynamics of Photoexcited Ceo Solid. Journal of physical chemistry, 100(22), 9223-9226. https://doi.org/10.1021/jp953642v