CaCu3Ti4O12 (CCTO) has been reported to possess a colossal dielectric constant owing to the intrinsic interfacial polarization via charge accumulations across the grain boundary. Herein, we explore the effects of unusual anion-doping on the dielectric properties of sputter-deposited CCTO thin films using an example of sulfur-doping. A post-annealing process of the films was utilized in a flowing H2S atmosphere for the sulfur-doping. The incorporation of sulfur into the perovskite structure was evidenced with the changes in chemical states, such as the reduced cations of Cu+ and Ti3+, the increased concentration of oxygen vacancies, and the formation of S-O[sbnd] bonds. The sulfurized CCTO thin films demonstrated an enhanced relative permittivity of ∼620 at 100 Hz, which is substantially better than that of the unsulfurized film. Direct measurement of the grain-boundary potential using Kelvin probe force microscopy suggests that the enhanced relative permittivity is associated with an increased Schottky barrier height.
|Number of pages||7|
|Journal||Journal of the European Ceramic Society|
|Publication status||Published - 2020 Jun|
Bibliographical noteFunding Information:
This work was financially supported by grants from the National Research Foundation of Korea ( NRF-2016M3A7B4910151 ); the Industrial Strategic Technology Development Program of the Ministry of Trade, Industry, & Energy ( # 10079981 ); and the Creative Materials Discovery Program of the Ministry of Science and ICT ( 2018M3D1A1058536 ).
© 2020 Elsevier Ltd
All Science Journal Classification (ASJC) codes
- Ceramics and Composites
- Materials Chemistry