Enhanced performance of solution-processed amorphous gallium-doped indium oxide thin-film transistors after hydrogen peroxide vapor treatment

Jee Ho Park, Young Bum Yoo, Jin Young Oh, Ji Hoon Lee, Tae Il Lee, Hong Koo Baik

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

We fabricated solution-processed gallium-doped indium oxide (GIO) thin-film transistors (TFTs) and performed hydrogen peroxide (H2O2) vapor treatment at 350 °C. We demonstrated that H2O and H 2O2 vapor treatment enhanced the performance of the GIO TFTs. The GIO TFT only annealed in ambient air at 350 °C performed very poorly, whereas those annealed in air with H2O2 and H 2O vapor at 350 °C exhibited significantly improved electrical performance. In particular, the H2O2-vapor-treated GIO TFTs had a mobility of 3.22 cm2V-1 s-1. We believe that this method can help decrease the annealing temperature in order to obtain high-performance GIO TFTs.

Original languageEnglish
Article number051101
JournalApplied Physics Express
Volume7
Issue number5
DOIs
Publication statusPublished - 2014 May

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Enhanced performance of solution-processed amorphous gallium-doped indium oxide thin-film transistors after hydrogen peroxide vapor treatment'. Together they form a unique fingerprint.

Cite this