Enhancement in positive bias stress stability of In-Ga-Zn-O thin-film transistors with vertically graded-oxygen-vacancy active layer

Yeong Gyu Kim, Seokhyun Yoon, Seonghwan Hong, Jong Sun Choi, Hyun Jae Kim

Research output: Contribution to journalConference article

1 Citation (Scopus)

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Engineering & Materials Science