Enhancement of image sharpness and height measurement using a low-speckle light source based on a patterned quantum dot film in dual-wavelength digital holography

Se Hwan Jang, Ki Baek Kim, Juwon Jung, Young Joo Kim

Research output: Contribution to journalArticlepeer-review

Abstract

A dual-wavelength single light source based on a patterned quantum dot (QD) film was developed with a 405nm LED and bandpass filters to increase color conversion efficiency as well as to decouple the two peaks of dual-wavelength emitted from the QD film. A QD film was patterned laterally with two different sizes of QDs and was combined with bandpass filters to produce a high efficiency and low-speckle dual-wavelength light source. The experimental results showed that the developed dual-wavelength light source can decrease speckle noise to improve the reconstructed image sharpness and the accuracy on height measurement in dual-wavelength digital holography.

Original languageEnglish
Pages (from-to)34220-34228
Number of pages9
JournalOptics Express
Volume29
Issue number21
DOIs
Publication statusPublished - 2021 Oct 11

Bibliographical note

Funding Information:
Acknowledgments. This research was supported by the BK21 FOUR (Fostering Outstanding Universities for Research) funded by the Ministry of Education (MOE) of Korea and National Research Foundation (NRF) of Korea.

Publisher Copyright:
© 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement.

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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