Enhancement of magnetoresistance in la0.75Ca 0.25MnO3 thin films grown on Si (1 0 0) substrates

J. C. Lee; D. G. You; S. Y. Ie; S. J. Kim; C. S. Kim; K. Jeong

doi:10.1016/S0304-8853(00)01022-2

Enhancement of magnetoresistance in la_0.75Ca _0.25MnO₃ thin films grown on Si (1 0 0) substrates

J. C. Lee, D. G. You, S. Y. Ie, S. J. Kim, C. S. Kim, K. Jeong

Department of Physics

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

The enhancement of magnetoresistance (MR) in La_0.75Ca _0.25MnO₃ thin films, grown on Si (100) substrates by RF magnetron sputtering, is studied. The films have single phase and show characteristics of a cubic perovskite structure. The out-of-plane lattice parameters of films are reduced as much as 0.9 % compared with the one of the bulk sample. It is found that the maximum MR (Δρ/ρ₀) of films are 0.34, 0.29 and 0.27 under the magnetic field of 1.5 T for each film with deposition temperatures of 700°C, 750°C and 800°C, respectively. The correlation between the magnetotransport property and lattice parameters of films is discussed. It seems that the enhancement of maximum MR can be attributed to the reduction of out-of-plane lattice parameters.

Original language	English
Pages (from-to)	1678-1680
Number of pages	3
Journal	Journal of Magnetism and Magnetic Materials
Volume	226-230
Issue number	PART II
DOIs	https://doi.org/10.1016/S0304-8853(00)01022-2
Publication status	Published - 2001

Bibliographical note

Funding Information:
This work was supported by the Brain Korea 21 project and Korea Science and Engineering Foundation (97-0702-0401-5).

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Access to Document

10.1016/S0304-8853(00)01022-2

Cite this

@article{7419209e92974fe88488d7ebd6244342,

title = "Enhancement of magnetoresistance in la0.75Ca 0.25MnO3 thin films grown on Si (1 0 0) substrates",

abstract = "The enhancement of magnetoresistance (MR) in La0.75Ca 0.25MnO3 thin films, grown on Si (100) substrates by RF magnetron sputtering, is studied. The films have single phase and show characteristics of a cubic perovskite structure. The out-of-plane lattice parameters of films are reduced as much as 0.9 % compared with the one of the bulk sample. It is found that the maximum MR (Δρ/ρ0) of films are 0.34, 0.29 and 0.27 under the magnetic field of 1.5 T for each film with deposition temperatures of 700°C, 750°C and 800°C, respectively. The correlation between the magnetotransport property and lattice parameters of films is discussed. It seems that the enhancement of maximum MR can be attributed to the reduction of out-of-plane lattice parameters.",

author = "Lee, {J. C.} and You, {D. G.} and Ie, {S. Y.} and Kim, {S. J.} and Kim, {C. S.} and K. Jeong",

note = "Funding Information: This work was supported by the Brain Korea 21 project and Korea Science and Engineering Foundation (97-0702-0401-5).",

year = "2001",

doi = "10.1016/S0304-8853(00)01022-2",

language = "English",

volume = "226-230",

pages = "1678--1680",

journal = "Journal of Magnetism and Magnetic Materials",

issn = "0304-8853",

publisher = "Elsevier",

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}

TY - JOUR

T1 - Enhancement of magnetoresistance in la0.75Ca 0.25MnO3 thin films grown on Si (1 0 0) substrates

AU - Lee, J. C.

AU - You, D. G.

AU - Ie, S. Y.

AU - Kim, S. J.

AU - Kim, C. S.

AU - Jeong, K.

N1 - Funding Information: This work was supported by the Brain Korea 21 project and Korea Science and Engineering Foundation (97-0702-0401-5).

PY - 2001

Y1 - 2001

N2 - The enhancement of magnetoresistance (MR) in La0.75Ca 0.25MnO3 thin films, grown on Si (100) substrates by RF magnetron sputtering, is studied. The films have single phase and show characteristics of a cubic perovskite structure. The out-of-plane lattice parameters of films are reduced as much as 0.9 % compared with the one of the bulk sample. It is found that the maximum MR (Δρ/ρ0) of films are 0.34, 0.29 and 0.27 under the magnetic field of 1.5 T for each film with deposition temperatures of 700°C, 750°C and 800°C, respectively. The correlation between the magnetotransport property and lattice parameters of films is discussed. It seems that the enhancement of maximum MR can be attributed to the reduction of out-of-plane lattice parameters.

AB - The enhancement of magnetoresistance (MR) in La0.75Ca 0.25MnO3 thin films, grown on Si (100) substrates by RF magnetron sputtering, is studied. The films have single phase and show characteristics of a cubic perovskite structure. The out-of-plane lattice parameters of films are reduced as much as 0.9 % compared with the one of the bulk sample. It is found that the maximum MR (Δρ/ρ0) of films are 0.34, 0.29 and 0.27 under the magnetic field of 1.5 T for each film with deposition temperatures of 700°C, 750°C and 800°C, respectively. The correlation between the magnetotransport property and lattice parameters of films is discussed. It seems that the enhancement of maximum MR can be attributed to the reduction of out-of-plane lattice parameters.

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JF - Journal of Magnetism and Magnetic Materials

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