Scan-based debug methods give high observability of internal signals, however, they require halting the system to scan out responses from the circuit-under-debug (CUD). This is time consuming as many scan dumps may be required. In this paper, conventional scan chains that have non-destructive scan out capability are configured to operate as multiple MISRs during system operation. Information from the multiple MISRs is monitored periodically to identify erroneous behavior. A procedure for constructing the MISRs to maximize debug capability is described. A three step process is used to zero in on the first clock cycle in which an error is present with a small number of scan dumps. Moreover, a method for bypassing errors is described to permit debug in the presence of multiple bugs.
|Number of pages||9|
|Journal||Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems|
|Publication status||Published - 2008|
|Event||23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2008 - Boston, MA, United States|
Duration: 2008 Oct 1 → 2008 Oct 3
All Science Journal Classification (ASJC) codes