Scan test data compression is widely used in industry to reduce test data volume (TDV) and test application time (TAT). This paper shows how multiple scan chain expansion ratios can help to obtain high test data compression in system-on-chips. Scan chains are partitioned with a higher expansion ratio than normal in scan compression mode and then are gradually concatenated based on a cost function to detect any faults that could not be detected at the higher expansion ratios. It improves the overall test compression ratio since it potentially allows faults to be detected at the highest expansion ratio. This paper introduces a new cost function to choose scan chain concatenation candidates for concatenation for multiple expansion ratios. To avoid TDV and TAT increase by scan concatenation, the proposed method takes a logic structure and scan chain length into consideration. Experiment results show the proposed method reduces TAT and TDV by 53%-64% compared with a traditional scan compression method.
|Number of pages||9|
|Journal||IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems|
|Publication status||Published - 2017 Sep|
Bibliographical noteFunding Information:
Manuscript received May 15, 2016; revised August 9, 2016; accepted October 11, 2016. Date of publication March 10, 2017; date of current version August 18, 2017. This work was supported in part by the Basic Science Research Program through the National Research Foundation of Korea by the Ministry of Education under Grant NRF-2015R1D1A1A01058856, in part by the Korea Institute for Advancement of Technology (KIAT) by the Korean Government (Motie:Ministry of Trade, Industry & Energy, HRD Program for Software-SoC Convergence) under Grant N0001883, in part by Samsung Research Fund, and in part by the National Science Foundation under Grant CCF-1617665. This paper was recommended by Associate Editor N. Nicolici.
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All Science Journal Classification (ASJC) codes
- Computer Graphics and Computer-Aided Design
- Electrical and Electronic Engineering