Enrely: A reliable MLC PCM Architecture based on Data Encoding

Muhammad Imran, Taehyun Kwon, Joon Sung Yang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Phase Change Memory (PCM) has promising features of a good candidate to replace existing memory technologies. Multi-level cell (MLC) operation leads to enhanced storage density in PCM It however suffers from poor reliability due to the resistance drift problem. Exploiting the data-dependent nature of the resistance drift problem, we introduce a novel MLC PCM architecture, named 'Enrely' based on effective data encoding. With a simple flip operation applied ingeniously to the data prior to a write, Enrely enhances the reliability of MLC PCM. Simulation results indicate up to an order of 104 times reduction in Error Rate using Enrely as compared to the conventional MLC PCM.

Original languageEnglish
Title of host publication34th International Technical Conference on Circuits/Systems, Computers and Communications, ITC-CSCC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728132716
DOIs
Publication statusPublished - 2019 Jun
Event34th International Technical Conference on Circuits/Systems, Computers and Communications, ITC-CSCC 2019 - JeJu, Korea, Republic of
Duration: 2019 Jun 232019 Jun 26

Publication series

Name34th International Technical Conference on Circuits/Systems, Computers and Communications, ITC-CSCC 2019

Conference

Conference34th International Technical Conference on Circuits/Systems, Computers and Communications, ITC-CSCC 2019
CountryKorea, Republic of
CityJeJu
Period19/6/2319/6/26

Bibliographical note

Funding Information:
This work was supported in part by the Basic Science Research Program through the National Research Foundation of Korea by the Ministry of Education under Grant NRF-2018R1D1A1B07049842, and in part by the MOTIE (Ministry of Trade, Industry Energy (10080594) and KSRC (Korea Semiconductor Research Consortium) support program for the development of the future semiconductor device.

All Science Journal Classification (ASJC) codes

  • Information Systems
  • Electrical and Electronic Engineering
  • Artificial Intelligence
  • Computer Networks and Communications
  • Hardware and Architecture

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