EOF: Efficient built-in redundancy analysis methodology with optimal repair rate

Myung Hoon Yang; Hyungjun Cho; Wooheon Kang; Sungho Kang

doi:10.1109/TCAD.2010.2044846

EOF: Efficient built-in redundancy analysis methodology with optimal repair rate

Myung Hoon Yang, Hyungjun Cho, Wooheon Kang, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

Faulty cell repair with redundancy can improve memory yield. In particular, built-in redundancy analysis (BIRA) is widely used to enhance the yield of embedded memories. We propose an efficient BIRA algorithm to achieve the optimal repair rate with a very short analysis time and low hardware cost. The proposed algorithm can significantly reduce the number of backtracks in the exhaustive search algorithm: it uses early termination based on the number of orthogonal faulty cells and fault classification in fault collection. Experimental results show that the proposed BIRA methodology can achieve optimal repair rate with low hardware overhead and short analysis time, as compared to previous BIRA methods.

Original language	English
Article number	5487466
Pages (from-to)	1130-1135
Number of pages	6
Journal	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume	29
Issue number	7
DOIs	https://doi.org/10.1109/TCAD.2010.2044846
Publication status	Published - 2010 Jul

Bibliographical note

Funding Information:
Manuscript received November 13, 2009; revised January 28, 2010. Date of current version June 18, 2010. The work of I. Pomeranz and S. M. Reddy was supported in part by the Semiconductor Research Corporation, under Grants 2007-TJ-1643 and 2007-TJ-1642, respectively. This paper was recommended by Associate Editor, F. Lombardi.

All Science Journal Classification (ASJC) codes

Software
Computer Graphics and Computer-Aided Design
Electrical and Electronic Engineering

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abstract = "Faulty cell repair with redundancy can improve memory yield. In particular, built-in redundancy analysis (BIRA) is widely used to enhance the yield of embedded memories. We propose an efficient BIRA algorithm to achieve the optimal repair rate with a very short analysis time and low hardware cost. The proposed algorithm can significantly reduce the number of backtracks in the exhaustive search algorithm: it uses early termination based on the number of orthogonal faulty cells and fault classification in fault collection. Experimental results show that the proposed BIRA methodology can achieve optimal repair rate with low hardware overhead and short analysis time, as compared to previous BIRA methods.",

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note = "Funding Information: Manuscript received November 13, 2009; revised January 28, 2010. Date of current version June 18, 2010. The work of I. Pomeranz and S. M. Reddy was supported in part by the Semiconductor Research Corporation, under Grants 2007-TJ-1643 and 2007-TJ-1642, respectively. This paper was recommended by Associate Editor, F. Lombardi.",

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AB - Faulty cell repair with redundancy can improve memory yield. In particular, built-in redundancy analysis (BIRA) is widely used to enhance the yield of embedded memories. We propose an efficient BIRA algorithm to achieve the optimal repair rate with a very short analysis time and low hardware cost. The proposed algorithm can significantly reduce the number of backtracks in the exhaustive search algorithm: it uses early termination based on the number of orthogonal faulty cells and fault classification in fault collection. Experimental results show that the proposed BIRA methodology can achieve optimal repair rate with low hardware overhead and short analysis time, as compared to previous BIRA methods.

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EOF: Efficient built-in redundancy analysis methodology with optimal repair rate

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

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