EOF: Efficient built-in redundancy analysis methodology with optimal repair rate

Myung Hoon Yang, Hyungjun Cho, Wooheon Kang, Sungho Kang

Research output: Contribution to journalArticle

11 Citations (Scopus)


Faulty cell repair with redundancy can improve memory yield. In particular, built-in redundancy analysis (BIRA) is widely used to enhance the yield of embedded memories. We propose an efficient BIRA algorithm to achieve the optimal repair rate with a very short analysis time and low hardware cost. The proposed algorithm can significantly reduce the number of backtracks in the exhaustive search algorithm: it uses early termination based on the number of orthogonal faulty cells and fault classification in fault collection. Experimental results show that the proposed BIRA methodology can achieve optimal repair rate with low hardware overhead and short analysis time, as compared to previous BIRA methods.

Original languageEnglish
Article number5487466
Pages (from-to)1130-1135
Number of pages6
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Issue number7
Publication statusPublished - 2010 Jul 1


All Science Journal Classification (ASJC) codes

  • Software
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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