ErAs/InGaAs superlattice Seebeck coefficient

Gehong Zeng, John E. Bowers, Yan Zhang, Ali Shakouri, Joshua Zide, Arthur Gossard, Woochul Kim, Arun Majumdar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

InGaAs with embedded ErAs nano-particles is a promising material for thermoelectric applications. The incorporation of erbium arsenide metallic nanoparticles into the semiconductor can provide both charge carriers and create scattering centers for phonons. Electron filtering by heterostructure barriers can also enhance Seebeck coefficient by selective emission of hot electrons. 2.1μm-thick ErAs/InGaAs superlattices with a period of 10 nm InAlGaAs and 20 nm InGaAs were grown using molecular beam epitaxy, and the effective doping is from 2x10 18 to 1x10 19 cm 3. Special device patterns were developed for the measurement of the cross-plane Seebeck coefficient of the superlattice layers.. Using these device patterns, the combined Seebeck coefficient of superlattice and the substrate were measured and the temperature drops through the superlattice and InP substrate were determined with 3D ANSYS® simulations. The Seebeck coefficient of the superlattice layers is obtained based on the measurements and simulation results.

Original languageEnglish
Title of host publicationProceedings - ICT'05
Subtitle of host publication24th International Conference on Thermoelectrics
Pages488-491
Number of pages4
DOIs
Publication statusPublished - 2005
EventICT'05: 24th International Conference on Thermoelectrics - Clemson, SC, United States
Duration: 2005 Jun 192005 Jun 23

Publication series

NameInternational Conference on Thermoelectrics, ICT, Proceedings
Volume2005

Other

OtherICT'05: 24th International Conference on Thermoelectrics
CountryUnited States
CityClemson, SC
Period05/6/1905/6/23

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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