Erratum

Multiscale electrical contact resistance in clustered contact distribution (Journal of Physics D: Applied Physics (2009) 42 (165302))

Sangyoung Lee, Hyun Cho, Yong Hoon Jang

Research output: Contribution to journalComment/debate

Original languageEnglish
Article number249801
JournalJournal of Physics D: Applied Physics
Volume43
Issue number24
DOIs
Publication statusPublished - 2010 Jun 11

Fingerprint

Contact resistance
contact resistance
Physics
physics

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials
  • Acoustics and Ultrasonics
  • Surfaces, Coatings and Films

Cite this

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author = "Sangyoung Lee and Hyun Cho and Jang, {Yong Hoon}",
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