Erratum: Switching transient generation in surface interrogation scanning electrochemical microscopy and time-of-flight techniques (Analytical Chemistry (2015) 87 (12276-12280) DOI: 10.1021/acs.analchem.5b03542)

Hyun S. Ahn; Allen J. Bard

doi:10.1021/acs.analchem.5b04792

Erratum: Switching transient generation in surface interrogation scanning electrochemical microscopy and time-of-flight techniques (Analytical Chemistry (2015) 87 (12276-12280) DOI: 10.1021/acs.analchem.5b03542)

Hyun S. Ahn, Allen J. Bard

Department of Chemistry

Research output: Contribution to journal › Comment/debate › peer-review

1 Citation (Scopus)

Original language	English
Pages (from-to)	1494
Number of pages	1
Journal	Analytical Chemistry
Volume	88
Issue number	2
DOIs	https://doi.org/10.1021/acs.analchem.5b04792
Publication status	Published - 2016 Jan 19

All Science Journal Classification (ASJC) codes

Analytical Chemistry

Access to Document

10.1021/acs.analchem.5b04792

Cite this

@article{18183a9c514343f4ab73d793619074d0,

title = "Erratum: Switching transient generation in surface interrogation scanning electrochemical microscopy and time-of-flight techniques (Analytical Chemistry (2015) 87 (12276-12280) DOI: 10.1021/acs.analchem.5b03542)",

author = "Ahn, {Hyun S.} and Bard, {Allen J.}",

year = "2016",

month = jan,

day = "19",

doi = "10.1021/acs.analchem.5b04792",

language = "English",

volume = "88",

pages = "1494",

journal = "Analytical Chemistry",

issn = "0003-2700",

number = "2",

}

Erratum : Switching transient generation in surface interrogation scanning electrochemical microscopy and time-of-flight techniques (Analytical Chemistry (2015) 87 (12276-12280) DOI: 10.1021/acs.analchem.5b03542). / Ahn, Hyun S.; Bard, Allen J.

In: Analytical Chemistry, Vol. 88, No. 2, 19.01.2016, p. 1494.

Research output: Contribution to journal › Comment/debate › peer-review

TY - JOUR

T1 - Erratum

T2 - Switching transient generation in surface interrogation scanning electrochemical microscopy and time-of-flight techniques (Analytical Chemistry (2015) 87 (12276-12280) DOI: 10.1021/acs.analchem.5b03542)

AU - Ahn, Hyun S.

AU - Bard, Allen J.

PY - 2016/1/19

Y1 - 2016/1/19

UR - http://www.scopus.com/inward/record.url?scp=84955496986&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84955496986&partnerID=8YFLogxK

U2 - 10.1021/acs.analchem.5b04792

DO - 10.1021/acs.analchem.5b04792

M3 - Comment/debate

AN - SCOPUS:84955496986

SN - 0003-2700

VL - 88

SP - 1494

JO - Analytical Chemistry

JF - Analytical Chemistry

IS - 2

ER -

Erratum: Switching transient generation in surface interrogation scanning electrochemical microscopy and time-of-flight techniques (Analytical Chemistry (2015) 87 (12276-12280) DOI: 10.1021/acs.analchem.5b03542)

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Cite this