Evaluating the manufacturability of GaAs/AlGaAs multiple quantum well avalanche photodiodes using neural networks

Ilgu Yun, Gary S. May

Research output: Contribution to conferencePaper

1 Citation (Scopus)

Abstract

This paper presents a novel methodology for the parametric yield prediction of GaAs/AlGaAs multiple quantum well (MQW) avalanche photodiodes (APDs). Even in a defect-free manufacturing environment, random variations in the APD fabrication process lead to varying levels of device performance. Accurate performance prediction requires precise characterization of these variations. The approach described herein requires a model of the probability distribution of each of the relevant process variables, as well as a model to account for the correlation between this measured process data and device performance metrics. Neural networks are proposed as a tool for generating these models, which enable the computation of the joint density function required for predicting performance using Jacobian transformation method. The resulting density function can then be numerically integrated to determine parametric yield. In apply this methodology to MQW APDs, using a small number of test devices enables accurate prediction of the expected performance variation of APD gain and noise in larger populations of devices. This approach potentially allows yield estimation prior to high volume manufacturing.

Original languageEnglish
Pages105-112
Number of pages8
Publication statusPublished - 1997 Dec 1
EventProceedings of the 1997 21st IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium - Austin, TX, USA
Duration: 1997 Oct 131997 Oct 15

Other

OtherProceedings of the 1997 21st IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium
CityAustin, TX, USA
Period97/10/1397/10/15

Fingerprint

Avalanche photodiodes
Semiconductor quantum wells
Neural networks
Probability density function
Probability distributions
Fabrication
Defects

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Yun, I., & May, G. S. (1997). Evaluating the manufacturability of GaAs/AlGaAs multiple quantum well avalanche photodiodes using neural networks. 105-112. Paper presented at Proceedings of the 1997 21st IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium, Austin, TX, USA, .
Yun, Ilgu ; May, Gary S. / Evaluating the manufacturability of GaAs/AlGaAs multiple quantum well avalanche photodiodes using neural networks. Paper presented at Proceedings of the 1997 21st IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium, Austin, TX, USA, .8 p.
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abstract = "This paper presents a novel methodology for the parametric yield prediction of GaAs/AlGaAs multiple quantum well (MQW) avalanche photodiodes (APDs). Even in a defect-free manufacturing environment, random variations in the APD fabrication process lead to varying levels of device performance. Accurate performance prediction requires precise characterization of these variations. The approach described herein requires a model of the probability distribution of each of the relevant process variables, as well as a model to account for the correlation between this measured process data and device performance metrics. Neural networks are proposed as a tool for generating these models, which enable the computation of the joint density function required for predicting performance using Jacobian transformation method. The resulting density function can then be numerically integrated to determine parametric yield. In apply this methodology to MQW APDs, using a small number of test devices enables accurate prediction of the expected performance variation of APD gain and noise in larger populations of devices. This approach potentially allows yield estimation prior to high volume manufacturing.",
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Yun, I & May, GS 1997, 'Evaluating the manufacturability of GaAs/AlGaAs multiple quantum well avalanche photodiodes using neural networks', Paper presented at Proceedings of the 1997 21st IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium, Austin, TX, USA, 97/10/13 - 97/10/15 pp. 105-112.

Evaluating the manufacturability of GaAs/AlGaAs multiple quantum well avalanche photodiodes using neural networks. / Yun, Ilgu; May, Gary S.

1997. 105-112 Paper presented at Proceedings of the 1997 21st IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium, Austin, TX, USA, .

Research output: Contribution to conferencePaper

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Yun I, May GS. Evaluating the manufacturability of GaAs/AlGaAs multiple quantum well avalanche photodiodes using neural networks. 1997. Paper presented at Proceedings of the 1997 21st IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium, Austin, TX, USA, .