This study attempted to quantify the interstratificational broadening of the randomly interstratified illite/smectite (random IS) basal reflection and to evaluate the percentage of the interstratified illite layers (%I) from the result. The interstratificational broadening was quantified using the distributional discrepancy (D) defined as D= [Σt ∫ ft (obs) - ft (ref) ∫] 2, where ft (obs) is the frequency of a crystallite containing thickness, t (the number of layers), measured from a basal reflection broadened by interstratifications, and ft (ref) is the frequency for a basal reflection with no interstratificational broadening. The basal reflections at 5.2° 2θ under glycolation and 8.84° 2θ under thermal dehydration provided the ft (obs) and ft (ref) of random IS. The linear relation, D=2.17%I+2.49 (0≤%I≤30), was obtained from simulations for SWy-2 (Wyoming, USA).
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Condensed Matter Physics