Abstract
The problem of a printed circuit board (PCB) via is analyzed through the scattering parameter and the flux methods. The two results are compared in an effort to establish the relationship between the two techniques and evaluate their contributions. A ground via in a one-port and two-port configuration is studied in the time and frequency domains using the finite difference time domain (FDTD) and the finite element method (FEM) respectively. The scattering parameters for the via configuration are computed and compared for validation purposes.
Original language | English |
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Title of host publication | IEEE 2nd Topical Meeting on Electrical Performance of Electronic Packaging, EPEP 1993 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 119-121 |
Number of pages | 3 |
ISBN (Electronic) | 0780314271, 9780780314276 |
DOIs | |
Publication status | Published - 1993 |
Event | 2nd IEEE Topical Meeting on Electrical Performance of Electronic Packaging, EPEP 1993 - Monterey, United States Duration: 1993 Oct 20 → 1993 Oct 22 |
Publication series
Name | IEEE 2nd Topical Meeting on Electrical Performance of Electronic Packaging, EPEP 1993 |
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Conference
Conference | 2nd IEEE Topical Meeting on Electrical Performance of Electronic Packaging, EPEP 1993 |
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Country/Territory | United States |
City | Monterey |
Period | 93/10/20 → 93/10/22 |
Bibliographical note
Funding Information:Acknowlcdgmen ts This work 11a bwn supponcd by a11 award from INTEL Co. Rcrercnces 1. T. Wang. R.F.Harrington and J.R. Mauu., "Thc Equivalent Circuit of a Via," Trans. Soc. Compuler Simu- lations, Vo1.4, pp.97-123. 2. A. R. Djordjevic and T. K. Sarkar. "Umpumtion of Inductance of Simple Vias Hctwwri Two Suiplines Above a Ground Plane," lEEE Trans. of Microwave Theory tind Tcctiniqws, Vd 33. No. 3. PP. 265-26'3. 3. P. H. Harms, J-F k c and K. MiLtrd, "Characterizing the Cylindric.al Via Discontinuity." IEEE Trans. on Microwave Thtory and 'Rchniqws, V01.4 I, No.I , pp, i S.7- 156. P. .---.--__ . .. . . . . . kvdruUm olCIround 1nduclnnc;c in h n k J Clrtnbl h r s h
Publisher Copyright:
© 1993 IEEE.
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
- Electronic, Optical and Magnetic Materials