Evaluation of Metal Oxide Thin-Film Electrolyte-Gated Field Effect Transistors for Glucose Monitoring in Small Volume of Body Analytes

Hojoong Kim, You Seung Rim, Jang Yeon Kwon

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)


Monitoringof chronic diseases such as diabetes without painful detection from blood enables people to improve their quality of life. Although various nanomaterials have remarkable characteristics that allow them to be used, the complexity of reliable fabrication is still challenging for their real applications. By using InGaZnO, simply deposited as thin-film structure, combined with electrolyte-gated field-effect transistors, highly sensitive sensing performance was demonstrated. The sensor characteristics were evaluated on the device level in various concentration of pH and glucose. It also exhibited good sensing capability in a high ionic solution over the screening effect with low interference among potential impediments for glucose. The sensing range and detection limit of device represent that sensing glucose in tear level could be practicable.

Original languageEnglish
Article number9069179
Pages (from-to)9004-9010
Number of pages7
JournalIEEE Sensors Journal
Issue number16
Publication statusPublished - 2020 Aug 15

Bibliographical note

Funding Information:
Manuscript received November 14, 2019; revised February 2, 2020; accepted April 6, 2020. Date of publication April 16, 2020; date of current version July 17, 2020. This work was supported in part by the Ministry of Science and ICT (MIST), South Korea, through the ICT Consilience Creative Program supervised by the Institute for Information and Communications Technology Promotion (IITP) under Grant IITP-2019-2017-0-01015 and in part by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education under Grant 2017R1D1A1B03030818 and Grant NRF-2019R1A6A3A01096242. The associate editor coordinating the review of this article and approving it for publication was Dr. Chang-Soo Kim. (Corresponding authors: You Seung Rim; Jang-Yeon Kwon.) Hojoong Kim is with the School of Integrated Technology, Yonsei University, Incheon 21983, South Korea, also with the Yonsei Institute of Convergence Technology, Yonsei University, Incheon 21983, South Korea, and also with the School of Intelligent Mechatronics Engineering, Sejong University, Seoul 05009, South Korea.

Publisher Copyright:
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All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Electrical and Electronic Engineering


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