Evaluation of the load impedance in coaxial cable via time-frequency domain reflectometry

Yong June Shin, Edward J. Powers, Tok Son Choe, Seung Hoon Sung, Jong Gwan Yook, Jin Bae Park

Research output: Contribution to journalConference article

5 Citations (Scopus)

Abstract

A new impedance measurement methodology based on time-frequency domain reflectometry (TFDR) is proposed. For the evaluation of the reflection coefficient in time-frequency domain reflectometry, the distortion of the reflected wave by the frequency-dependent attenuation is compensated which otherwise results in inaccurate impedance measurement. Also, the phase difference between the incident and reflected waveforms caused by the state of the load impedance is evaluated by the cross time-frequency distribution which provides time-frequency localized phase difference information. The proposed methodology is verified by a set of numerical electromagnetic simulation experiments and the results are compared with classical time domain reflectometry (TDR). Impedance measurement via time-frequency domain reflectometry is more accurate over a wider range of impedances than TDR.

Original languageEnglish
Pages (from-to)38-46
Number of pages9
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5205
Publication statusPublished - 2003 Dec 1
EventAdvanced Signal Processing Algorithms, Architectures, and Implementations - San Diego, USA, United States
Duration: 2003 Aug 62003 Aug 8

Fingerprint

Reflectometry
coaxial cables
Coaxial cables
Coaxial
Cable
Impedance
Frequency Domain
Time Domain
impedance
evaluation
Evaluation
impedance measurement
Phase Difference
Methodology
Reflection Coefficient
Inaccurate
methodology
Attenuation
Waveform
Simulation Experiment

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

@article{443d334c1bc6414b951dc7c5564eddfd,
title = "Evaluation of the load impedance in coaxial cable via time-frequency domain reflectometry",
abstract = "A new impedance measurement methodology based on time-frequency domain reflectometry (TFDR) is proposed. For the evaluation of the reflection coefficient in time-frequency domain reflectometry, the distortion of the reflected wave by the frequency-dependent attenuation is compensated which otherwise results in inaccurate impedance measurement. Also, the phase difference between the incident and reflected waveforms caused by the state of the load impedance is evaluated by the cross time-frequency distribution which provides time-frequency localized phase difference information. The proposed methodology is verified by a set of numerical electromagnetic simulation experiments and the results are compared with classical time domain reflectometry (TDR). Impedance measurement via time-frequency domain reflectometry is more accurate over a wider range of impedances than TDR.",
author = "Shin, {Yong June} and Powers, {Edward J.} and Choe, {Tok Son} and Sung, {Seung Hoon} and Yook, {Jong Gwan} and Park, {Jin Bae}",
year = "2003",
month = "12",
day = "1",
language = "English",
volume = "5205",
pages = "38--46",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",

}

Evaluation of the load impedance in coaxial cable via time-frequency domain reflectometry. / Shin, Yong June; Powers, Edward J.; Choe, Tok Son; Sung, Seung Hoon; Yook, Jong Gwan; Park, Jin Bae.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 5205, 01.12.2003, p. 38-46.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Evaluation of the load impedance in coaxial cable via time-frequency domain reflectometry

AU - Shin, Yong June

AU - Powers, Edward J.

AU - Choe, Tok Son

AU - Sung, Seung Hoon

AU - Yook, Jong Gwan

AU - Park, Jin Bae

PY - 2003/12/1

Y1 - 2003/12/1

N2 - A new impedance measurement methodology based on time-frequency domain reflectometry (TFDR) is proposed. For the evaluation of the reflection coefficient in time-frequency domain reflectometry, the distortion of the reflected wave by the frequency-dependent attenuation is compensated which otherwise results in inaccurate impedance measurement. Also, the phase difference between the incident and reflected waveforms caused by the state of the load impedance is evaluated by the cross time-frequency distribution which provides time-frequency localized phase difference information. The proposed methodology is verified by a set of numerical electromagnetic simulation experiments and the results are compared with classical time domain reflectometry (TDR). Impedance measurement via time-frequency domain reflectometry is more accurate over a wider range of impedances than TDR.

AB - A new impedance measurement methodology based on time-frequency domain reflectometry (TFDR) is proposed. For the evaluation of the reflection coefficient in time-frequency domain reflectometry, the distortion of the reflected wave by the frequency-dependent attenuation is compensated which otherwise results in inaccurate impedance measurement. Also, the phase difference between the incident and reflected waveforms caused by the state of the load impedance is evaluated by the cross time-frequency distribution which provides time-frequency localized phase difference information. The proposed methodology is verified by a set of numerical electromagnetic simulation experiments and the results are compared with classical time domain reflectometry (TDR). Impedance measurement via time-frequency domain reflectometry is more accurate over a wider range of impedances than TDR.

UR - http://www.scopus.com/inward/record.url?scp=1842555516&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=1842555516&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:1842555516

VL - 5205

SP - 38

EP - 46

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

ER -