Evaluation of the Long-Term Reliability of Open-Tube Diffused Planar InGaAs/InP Avalanche Photodiodes under a Hybrid of Thermal and Electrical Stresses

Hyejeong Choi, Chan Yong Park, Soo Hyun Baek, Gap Yeal Moon, Ilgu Yun

Research output: Contribution to journalArticlepeer-review

Abstract

The long-term reliability of open-tube diffused planar InGaAs/InP APDs was investigated via accelerated life testing in this study. For the proposed life testing scheme, both thermal and electrical stresses were applied simultaneously to reduce the testing periods while maintaining statistical significance. Additionally, the Eyring model was used to extrapolate the activation energy. To determine the optimum life testing conditions, high-temperature storage tests, preliminary accelerated life tests, and main accelerated life tests were conducted. From the test results, the mean-time-to-failure was utilized to verify the suitability of the Eyring model. The proposed testing scheme, which utilizes a hybrid of accelerated stress factors, allows us to estimate the device reliability within an acceptable testing period, minimizing the time to market.

Original languageEnglish
Article number802
JournalElectronics (Switzerland)
Volume11
Issue number5
DOIs
Publication statusPublished - 2022 Mar 1

Bibliographical note

Funding Information:
Acknowledgments: This work was supported by the Advanced Technology Center Plus (ATC+) Program (20014170, Development of single-photon detection device based on eye-safe wavelength forautonomousdriving)fundedbytheMinistryofTrade,Industry&Energy(MOTIE,Korea)and also supportedbyY-BASE R&E Institute,aBrain Korea 21four program, Yonsei University.

Funding Information:
Acknowledgments: This work was supported by the Advanced Technology Center Plus (ATC+) Program (20014170, Development of single-photon detection device based on eye-safe wavelength for autonomous driving) funded by the Ministry of Trade, Industry & Energy (MOTIE, Korea) and also supported by Y-BASE R&E Institute, a Brain Korea 21 four program, Yonsei University.

Publisher Copyright:
© 2022 by the authors. Licensee MDPI, Basel, Switzerland.

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Signal Processing
  • Hardware and Architecture
  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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