### Abstract

For electrical impedance tomography (EIT), the linearized reconstruction method using the Fréchet derivative of the Neumann-to-Dirichlet map with respect to the conductivity has been widely used in the last three decades. However, few rigorous mathematical results are known regarding the errors caused by the linear approximation. In this work we prove that linearizing the inverse problem of EIT does not lead to shape errors for piecewise-analytic conductivities. If a solution of the linearized equations exists, then it has the same outer support as the true conductivity change, no matter how large the latter is. Under an additional definiteness condition we also show how to approximately solve the linearized equation so that the outer support converges toward the right one. Our convergence result is global and also applies for approximations by noisy finitedimensional data. Furthermore, we obtain bounds on how well the linear reconstructions and the true conductivity difference agree on the boundary of the outer support.

Original language | English |
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Pages (from-to) | 1505-1518 |

Number of pages | 14 |

Journal | SIAM Journal on Mathematical Analysis |

Volume | 42 |

Issue number | 4 |

DOIs | |

Publication status | Published - 2010 Sep 2 |

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### All Science Journal Classification (ASJC) codes

- Analysis
- Computational Mathematics
- Applied Mathematics

### Cite this

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*SIAM Journal on Mathematical Analysis*, vol. 42, no. 4, pp. 1505-1518. https://doi.org/10.1137/090773970

**Exact shape-reconstruction by one-step linearization in electrical impedance tomography.** / Harrach, Bastian; Seo, Jin Keun.

Research output: Contribution to journal › Article

TY - JOUR

T1 - Exact shape-reconstruction by one-step linearization in electrical impedance tomography

AU - Harrach, Bastian

AU - Seo, Jin Keun

PY - 2010/9/2

Y1 - 2010/9/2

N2 - For electrical impedance tomography (EIT), the linearized reconstruction method using the Fréchet derivative of the Neumann-to-Dirichlet map with respect to the conductivity has been widely used in the last three decades. However, few rigorous mathematical results are known regarding the errors caused by the linear approximation. In this work we prove that linearizing the inverse problem of EIT does not lead to shape errors for piecewise-analytic conductivities. If a solution of the linearized equations exists, then it has the same outer support as the true conductivity change, no matter how large the latter is. Under an additional definiteness condition we also show how to approximately solve the linearized equation so that the outer support converges toward the right one. Our convergence result is global and also applies for approximations by noisy finitedimensional data. Furthermore, we obtain bounds on how well the linear reconstructions and the true conductivity difference agree on the boundary of the outer support.

AB - For electrical impedance tomography (EIT), the linearized reconstruction method using the Fréchet derivative of the Neumann-to-Dirichlet map with respect to the conductivity has been widely used in the last three decades. However, few rigorous mathematical results are known regarding the errors caused by the linear approximation. In this work we prove that linearizing the inverse problem of EIT does not lead to shape errors for piecewise-analytic conductivities. If a solution of the linearized equations exists, then it has the same outer support as the true conductivity change, no matter how large the latter is. Under an additional definiteness condition we also show how to approximately solve the linearized equation so that the outer support converges toward the right one. Our convergence result is global and also applies for approximations by noisy finitedimensional data. Furthermore, we obtain bounds on how well the linear reconstructions and the true conductivity difference agree on the boundary of the outer support.

UR - http://www.scopus.com/inward/record.url?scp=77956066305&partnerID=8YFLogxK

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U2 - 10.1137/090773970

DO - 10.1137/090773970

M3 - Article

AN - SCOPUS:77956066305

VL - 42

SP - 1505

EP - 1518

JO - SIAM Journal on Mathematical Analysis

JF - SIAM Journal on Mathematical Analysis

SN - 0036-1410

IS - 4

ER -