Expanding trace buffer observation window for in-system silicon debug through selective capture

Joon Sung Yang, Nur A. Touba

Research output: Chapter in Book/Report/Conference proceedingConference contribution

32 Citations (Scopus)

Abstract

Trace buffers are commonly used to capture data during in-system silicon debug. This paper exploits the fact that it is not necessary to capture error-free data in the trace buffer since that information is obtainable from simulation. The trace buffer need only capture data during clock cycles in which errors are present. A three pass methodology is proposed. During the first pass, the rough error rate is measured, in the second pass, a set of suspect clock cycles where errors may be present is determined, and then in the third pass, the trace buffer captures only during the suspect clock cycles. In this manner, the effective observation window of the trace buffer can be expanded significantly, by up to orders of magnitude. This greatly increases the effectiveness of a given size trace buffer and can rapidly speed up the debug process. The suspect clock cycles are determined through a two dimensional (2-D) compaction technique using a combination of multiple-input signature register (MISR) signatures and cycling register signatures. By intersecting the signatures, the proposed 2-D compaction technique generates a small set of remaining suspect clock cycles for which the trace buffer needs to capture data. Experimental results indicate very significant increases in the effective observation window for a trace buffer can be obtained.

Original languageEnglish
Title of host publicationProceedings - 26th IEEE VLSI Test Symposium, VTS08
Pages345-351
Number of pages7
DOIs
Publication statusPublished - 2008
Event26th IEEE VLSI Test Symposium, VTS08 - San Diego, CA, United States
Duration: 2008 Apr 272008 May 1

Publication series

NameProceedings of the IEEE VLSI Test Symposium

Other

Other26th IEEE VLSI Test Symposium, VTS08
CountryUnited States
CitySan Diego, CA
Period08/4/2708/5/1

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

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  • Cite this

    Yang, J. S., & Touba, N. A. (2008). Expanding trace buffer observation window for in-system silicon debug through selective capture. In Proceedings - 26th IEEE VLSI Test Symposium, VTS08 (pp. 345-351). [4511748] (Proceedings of the IEEE VLSI Test Symposium). https://doi.org/10.1109/VTS.2008.41