Abstract
In industrial-type single-photon-emission computed tomography (SPECT) systems, the use of relatively large detectors and collimators for effective detection of highenergy gammas significantly limits imaging performance, primarily because of insufficient measurement points. In the present study, a simple but very effective image-quality improvement method, the double-layer method, was tested. In this method, two layers of identical SPECT systems are employed in order to increase the number of measurement points and, thereby, improve the image quality. For experimentation, the two identical detector layers were arranged for 30 deg of rotation with respect to each other. The results showed that the double-layer method indeed significantly improves the image quality of the industrial SPECT system, substantially reducing errors in source size and location for both low-energy ( 99m Tc) and high-energy ( 113m In) gamma sources.
| Original language | English |
|---|---|
| Pages (from-to) | 113-117 |
| Number of pages | 5 |
| Journal | Nuclear Technology |
| Volume | 175 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2011 Jan 1 |
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All Science Journal Classification (ASJC) codes
- Nuclear and High Energy Physics
- Nuclear Energy and Engineering
- Condensed Matter Physics
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Experimental test of double-layer method for industrial spect. / Park, Jang Guen; Kim, Chan Hyeong; Min, Chulhee; Jeong, Jong Hwi; Kim, Jong Bum; Moon, Jinho; Jung, Sung Hee.
In: Nuclear Technology, Vol. 175, No. 1, 01.01.2011, p. 113-117.Research output: Contribution to journal › Article
TY - JOUR
T1 - Experimental test of double-layer method for industrial spect
AU - Park, Jang Guen
AU - Kim, Chan Hyeong
AU - Min, Chulhee
AU - Jeong, Jong Hwi
AU - Kim, Jong Bum
AU - Moon, Jinho
AU - Jung, Sung Hee
PY - 2011/1/1
Y1 - 2011/1/1
N2 - In industrial-type single-photon-emission computed tomography (SPECT) systems, the use of relatively large detectors and collimators for effective detection of highenergy gammas significantly limits imaging performance, primarily because of insufficient measurement points. In the present study, a simple but very effective image-quality improvement method, the double-layer method, was tested. In this method, two layers of identical SPECT systems are employed in order to increase the number of measurement points and, thereby, improve the image quality. For experimentation, the two identical detector layers were arranged for 30 deg of rotation with respect to each other. The results showed that the double-layer method indeed significantly improves the image quality of the industrial SPECT system, substantially reducing errors in source size and location for both low-energy ( 99m Tc) and high-energy ( 113m In) gamma sources.
AB - In industrial-type single-photon-emission computed tomography (SPECT) systems, the use of relatively large detectors and collimators for effective detection of highenergy gammas significantly limits imaging performance, primarily because of insufficient measurement points. In the present study, a simple but very effective image-quality improvement method, the double-layer method, was tested. In this method, two layers of identical SPECT systems are employed in order to increase the number of measurement points and, thereby, improve the image quality. For experimentation, the two identical detector layers were arranged for 30 deg of rotation with respect to each other. The results showed that the double-layer method indeed significantly improves the image quality of the industrial SPECT system, substantially reducing errors in source size and location for both low-energy ( 99m Tc) and high-energy ( 113m In) gamma sources.
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U2 - 10.13182/NT175-113
DO - 10.13182/NT175-113
M3 - Article
AN - SCOPUS:79960686444
VL - 175
SP - 113
EP - 117
JO - Nuclear Technology
JF - Nuclear Technology
SN - 0029-5450
IS - 1
ER -