Experimental test of double-layer method for industrial spect

Jang Guen Park; Chan Hyeong Kim; Chulhee Min; Jong Hwi Jeong; Jong Bum Kim; Jinho Moon; Sung Hee Jung

doi:10.13182/NT175-113

Experimental test of double-layer method for industrial spect

Jang Guen Park, Chan Hyeong Kim, Chulhee Min, Jong Hwi Jeong, Jong Bum Kim, Jinho Moon, Sung Hee Jung

Radiological Science

Research output: Contribution to journal › Article

5 Citations (Scopus)

Abstract

In industrial-type single-photon-emission computed tomography (SPECT) systems, the use of relatively large detectors and collimators for effective detection of highenergy gammas significantly limits imaging performance, primarily because of insufficient measurement points. In the present study, a simple but very effective image-quality improvement method, the double-layer method, was tested. In this method, two layers of identical SPECT systems are employed in order to increase the number of measurement points and, thereby, improve the image quality. For experimentation, the two identical detector layers were arranged for 30 deg of rotation with respect to each other. The results showed that the double-layer method indeed significantly improves the image quality of the industrial SPECT system, substantially reducing errors in source size and location for both low-energy ( ^99m Tc) and high-energy ( ^113m In) gamma sources.

Original language	English
Pages (from-to)	113-117
Number of pages	5
Journal	Nuclear Technology
Volume	175
Issue number	1
DOIs	https://doi.org/10.13182/NT175-113
Publication status	Published - 2011 Jan 1

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All Science Journal Classification (ASJC) codes

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Condensed Matter Physics

Cite this

Park, J. G., Kim, C. H., Min, C., Jeong, J. H., Kim, J. B., Moon, J., & Jung, S. H. (2011). Experimental test of double-layer method for industrial spect. Nuclear Technology, 175(1), 113-117. https://doi.org/10.13182/NT175-113

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10.13182/NT175-113