Experimental test of double-layer method for industrial spect

Jang Guen Park, Chan Hyeong Kim, Chulhee Min, Jong Hwi Jeong, Jong Bum Kim, Jinho Moon, Sung Hee Jung

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

In industrial-type single-photon-emission computed tomography (SPECT) systems, the use of relatively large detectors and collimators for effective detection of highenergy gammas significantly limits imaging performance, primarily because of insufficient measurement points. In the present study, a simple but very effective image-quality improvement method, the double-layer method, was tested. In this method, two layers of identical SPECT systems are employed in order to increase the number of measurement points and, thereby, improve the image quality. For experimentation, the two identical detector layers were arranged for 30 deg of rotation with respect to each other. The results showed that the double-layer method indeed significantly improves the image quality of the industrial SPECT system, substantially reducing errors in source size and location for both low-energy ( 99m Tc) and high-energy ( 113m In) gamma sources.

Original languageEnglish
Pages (from-to)113-117
Number of pages5
JournalNuclear Technology
Volume175
Issue number1
DOIs
Publication statusPublished - 2011 Jan 1

Fingerprint

Single photon emission computed tomography
Image quality
tomography
Detectors
photons
detectors
experimentation
collimators
Imaging techniques
energy

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Condensed Matter Physics

Cite this

Park, J. G., Kim, C. H., Min, C., Jeong, J. H., Kim, J. B., Moon, J., & Jung, S. H. (2011). Experimental test of double-layer method for industrial spect. Nuclear Technology, 175(1), 113-117. https://doi.org/10.13182/NT175-113
Park, Jang Guen ; Kim, Chan Hyeong ; Min, Chulhee ; Jeong, Jong Hwi ; Kim, Jong Bum ; Moon, Jinho ; Jung, Sung Hee. / Experimental test of double-layer method for industrial spect. In: Nuclear Technology. 2011 ; Vol. 175, No. 1. pp. 113-117.
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Park, JG, Kim, CH, Min, C, Jeong, JH, Kim, JB, Moon, J & Jung, SH 2011, 'Experimental test of double-layer method for industrial spect', Nuclear Technology, vol. 175, no. 1, pp. 113-117. https://doi.org/10.13182/NT175-113

Experimental test of double-layer method for industrial spect. / Park, Jang Guen; Kim, Chan Hyeong; Min, Chulhee; Jeong, Jong Hwi; Kim, Jong Bum; Moon, Jinho; Jung, Sung Hee.

In: Nuclear Technology, Vol. 175, No. 1, 01.01.2011, p. 113-117.

Research output: Contribution to journalArticle

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Park JG, Kim CH, Min C, Jeong JH, Kim JB, Moon J et al. Experimental test of double-layer method for industrial spect. Nuclear Technology. 2011 Jan 1;175(1):113-117. https://doi.org/10.13182/NT175-113