Exploiting poly(dimethylsiloxane)-modified tips to evaluate frictional behavior by friction force microscopy

Jeong Ho Cho, Dae Ho Lee, Hwa Sung Shin, Sudip K. Pattanayek, Chang Y. Ryu, Kilwon Cho

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

With the aim of investigating the effect of the surface properties on the friction behavior of self-assembled monolayers, we have modified tipless atomic force microscopy (AFM) cantilevers with a poly(dimethylsiloxane) (PDMS) lens. The friction coefficient using the silicon tip is strongly influenced by the mechanical properties of the substrate monolayer because hard, sharp silicon tips penetrate the surface of organic monolayers. However, the friction coefficient obtained for the PDMS-modified AFM cantilever is mostly due to the surface properties of the monolayer functional end group, rather than the viscoelastic deformation of the monolayer. The use of the PDMS tip was demonstrated as a novel means to investigate the effect of surface properties on the frictional behavior of self-assembled monolayers with various functional groups with less mechanical deformation.

Original languageEnglish
Pages (from-to)11499-11503
Number of pages5
JournalLangmuir
Volume20
Issue number26
DOIs
Publication statusPublished - 2004 Dec 21

Fingerprint

Polydimethylsiloxane
Monolayers
Microscopic examination
friction
atomic force microscopy
Friction
surface properties
microscopy
Surface properties
Self assembled monolayers
Silicon
coefficient of friction
Atomic force microscopy
silicon
Functional groups
Lenses
lenses
mechanical properties
Mechanical properties
baysilon

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Spectroscopy
  • Electrochemistry

Cite this

Cho, Jeong Ho ; Lee, Dae Ho ; Shin, Hwa Sung ; Pattanayek, Sudip K. ; Ryu, Chang Y. ; Cho, Kilwon. / Exploiting poly(dimethylsiloxane)-modified tips to evaluate frictional behavior by friction force microscopy. In: Langmuir. 2004 ; Vol. 20, No. 26. pp. 11499-11503.
@article{e1d7d3d038c3495db8e73443159a0183,
title = "Exploiting poly(dimethylsiloxane)-modified tips to evaluate frictional behavior by friction force microscopy",
abstract = "With the aim of investigating the effect of the surface properties on the friction behavior of self-assembled monolayers, we have modified tipless atomic force microscopy (AFM) cantilevers with a poly(dimethylsiloxane) (PDMS) lens. The friction coefficient using the silicon tip is strongly influenced by the mechanical properties of the substrate monolayer because hard, sharp silicon tips penetrate the surface of organic monolayers. However, the friction coefficient obtained for the PDMS-modified AFM cantilever is mostly due to the surface properties of the monolayer functional end group, rather than the viscoelastic deformation of the monolayer. The use of the PDMS tip was demonstrated as a novel means to investigate the effect of surface properties on the frictional behavior of self-assembled monolayers with various functional groups with less mechanical deformation.",
author = "Cho, {Jeong Ho} and Lee, {Dae Ho} and Shin, {Hwa Sung} and Pattanayek, {Sudip K.} and Ryu, {Chang Y.} and Kilwon Cho",
year = "2004",
month = "12",
day = "21",
doi = "10.1021/la048409f",
language = "English",
volume = "20",
pages = "11499--11503",
journal = "Langmuir",
issn = "0743-7463",
publisher = "American Chemical Society",
number = "26",

}

Exploiting poly(dimethylsiloxane)-modified tips to evaluate frictional behavior by friction force microscopy. / Cho, Jeong Ho; Lee, Dae Ho; Shin, Hwa Sung; Pattanayek, Sudip K.; Ryu, Chang Y.; Cho, Kilwon.

In: Langmuir, Vol. 20, No. 26, 21.12.2004, p. 11499-11503.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Exploiting poly(dimethylsiloxane)-modified tips to evaluate frictional behavior by friction force microscopy

AU - Cho, Jeong Ho

AU - Lee, Dae Ho

AU - Shin, Hwa Sung

AU - Pattanayek, Sudip K.

AU - Ryu, Chang Y.

AU - Cho, Kilwon

PY - 2004/12/21

Y1 - 2004/12/21

N2 - With the aim of investigating the effect of the surface properties on the friction behavior of self-assembled monolayers, we have modified tipless atomic force microscopy (AFM) cantilevers with a poly(dimethylsiloxane) (PDMS) lens. The friction coefficient using the silicon tip is strongly influenced by the mechanical properties of the substrate monolayer because hard, sharp silicon tips penetrate the surface of organic monolayers. However, the friction coefficient obtained for the PDMS-modified AFM cantilever is mostly due to the surface properties of the monolayer functional end group, rather than the viscoelastic deformation of the monolayer. The use of the PDMS tip was demonstrated as a novel means to investigate the effect of surface properties on the frictional behavior of self-assembled monolayers with various functional groups with less mechanical deformation.

AB - With the aim of investigating the effect of the surface properties on the friction behavior of self-assembled monolayers, we have modified tipless atomic force microscopy (AFM) cantilevers with a poly(dimethylsiloxane) (PDMS) lens. The friction coefficient using the silicon tip is strongly influenced by the mechanical properties of the substrate monolayer because hard, sharp silicon tips penetrate the surface of organic monolayers. However, the friction coefficient obtained for the PDMS-modified AFM cantilever is mostly due to the surface properties of the monolayer functional end group, rather than the viscoelastic deformation of the monolayer. The use of the PDMS tip was demonstrated as a novel means to investigate the effect of surface properties on the frictional behavior of self-assembled monolayers with various functional groups with less mechanical deformation.

UR - http://www.scopus.com/inward/record.url?scp=11144241807&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=11144241807&partnerID=8YFLogxK

U2 - 10.1021/la048409f

DO - 10.1021/la048409f

M3 - Article

C2 - 15595775

AN - SCOPUS:11144241807

VL - 20

SP - 11499

EP - 11503

JO - Langmuir

JF - Langmuir

SN - 0743-7463

IS - 26

ER -