Extension of the T-bridge method for measuring the thermal conductivity of two-dimensional materials

Jungwon Kim, Dong Jea Seo, Hwanjoo Park, Hoon Kim, Heon Jin Choi, Woochul Kim

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

In this paper, the T-bridge method is extended to measure the thermal properties of two-dimensional nanomaterials. We present an analysis of the measureable positions, width, and thermal resistance of two-dimensional materials. For verification purposes, the thermal conductivity of a SiO2 nanoribbon was measured. To enhance the thermal contact between the nanoribbon and the heater in the setup, the nanoribbon was dipped into either isopropanol or water in order to promote a sticking force. Also, focused ion beam deposition was used to deposit the nanoribbon onto the contact. The thermal conductivities of all three cases were identical, showing that water dipping could be used to enhance the thermal contact. Due to the simple structure of this method and the analysis provided herein, the T-bridge method can be widely used for measuring the thermal conductivity of two-dimensional materials.

Original languageEnglish
Article number054902
JournalReview of Scientific Instruments
Volume88
Issue number5
DOIs
Publication statusPublished - 2017 May 1

Fingerprint

Nanoribbons
Thermal conductivity
thermal conductivity
electric contacts
thermal resistance
dipping
heaters
water
Focused ion beams
thermodynamic properties
ion beams
deposits
Nanostructured materials
Heat resistance
Water
Thermodynamic properties
Deposits
Hot Temperature

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

@article{379fe9308bd5415b9cc90c95c1a1aec4,
title = "Extension of the T-bridge method for measuring the thermal conductivity of two-dimensional materials",
abstract = "In this paper, the T-bridge method is extended to measure the thermal properties of two-dimensional nanomaterials. We present an analysis of the measureable positions, width, and thermal resistance of two-dimensional materials. For verification purposes, the thermal conductivity of a SiO2 nanoribbon was measured. To enhance the thermal contact between the nanoribbon and the heater in the setup, the nanoribbon was dipped into either isopropanol or water in order to promote a sticking force. Also, focused ion beam deposition was used to deposit the nanoribbon onto the contact. The thermal conductivities of all three cases were identical, showing that water dipping could be used to enhance the thermal contact. Due to the simple structure of this method and the analysis provided herein, the T-bridge method can be widely used for measuring the thermal conductivity of two-dimensional materials.",
author = "Jungwon Kim and Seo, {Dong Jea} and Hwanjoo Park and Hoon Kim and Choi, {Heon Jin} and Woochul Kim",
year = "2017",
month = "5",
day = "1",
doi = "10.1063/1.4982819",
language = "English",
volume = "88",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "5",

}

Extension of the T-bridge method for measuring the thermal conductivity of two-dimensional materials. / Kim, Jungwon; Seo, Dong Jea; Park, Hwanjoo; Kim, Hoon; Choi, Heon Jin; Kim, Woochul.

In: Review of Scientific Instruments, Vol. 88, No. 5, 054902, 01.05.2017.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Extension of the T-bridge method for measuring the thermal conductivity of two-dimensional materials

AU - Kim, Jungwon

AU - Seo, Dong Jea

AU - Park, Hwanjoo

AU - Kim, Hoon

AU - Choi, Heon Jin

AU - Kim, Woochul

PY - 2017/5/1

Y1 - 2017/5/1

N2 - In this paper, the T-bridge method is extended to measure the thermal properties of two-dimensional nanomaterials. We present an analysis of the measureable positions, width, and thermal resistance of two-dimensional materials. For verification purposes, the thermal conductivity of a SiO2 nanoribbon was measured. To enhance the thermal contact between the nanoribbon and the heater in the setup, the nanoribbon was dipped into either isopropanol or water in order to promote a sticking force. Also, focused ion beam deposition was used to deposit the nanoribbon onto the contact. The thermal conductivities of all three cases were identical, showing that water dipping could be used to enhance the thermal contact. Due to the simple structure of this method and the analysis provided herein, the T-bridge method can be widely used for measuring the thermal conductivity of two-dimensional materials.

AB - In this paper, the T-bridge method is extended to measure the thermal properties of two-dimensional nanomaterials. We present an analysis of the measureable positions, width, and thermal resistance of two-dimensional materials. For verification purposes, the thermal conductivity of a SiO2 nanoribbon was measured. To enhance the thermal contact between the nanoribbon and the heater in the setup, the nanoribbon was dipped into either isopropanol or water in order to promote a sticking force. Also, focused ion beam deposition was used to deposit the nanoribbon onto the contact. The thermal conductivities of all three cases were identical, showing that water dipping could be used to enhance the thermal contact. Due to the simple structure of this method and the analysis provided herein, the T-bridge method can be widely used for measuring the thermal conductivity of two-dimensional materials.

UR - http://www.scopus.com/inward/record.url?scp=85018455366&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85018455366&partnerID=8YFLogxK

U2 - 10.1063/1.4982819

DO - 10.1063/1.4982819

M3 - Article

AN - SCOPUS:85018455366

VL - 88

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 5

M1 - 054902

ER -