Facet reflectivity of antireflection-coated electroabsorption waveguide measured from photocurrent

Byung Kwon Kang, Yoon Ho Park, Seok Lee, Sun Ho Kim, Sang Sam Choi, Jungkeun Lee, Takeshi Kamiya, Seung Han Park

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A method to measure the low reflectivity of antireflection (AR)-coated electroabsorption (EA) waveguide facets by using the photocurrent is presented. The method is simple and efficient.

Original languageEnglish
Pages (from-to)500-501
Number of pages2
JournalConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume2
Publication statusPublished - 2000 Jan 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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