Facet reflectivity of antireflection-coated electroabsorption waveguide measured from photocurrent

Byung Kwon Kang; Yoon Ho Park; Seok Lee; Sun Ho Kim; Sang Sam Choi; Jungkeun Lee; Takeshi Kamiya; Seung Han Park

Facet reflectivity of antireflection-coated electroabsorption waveguide measured from photocurrent

Byung Kwon Kang, Yoon Ho Park, Seok Lee, Sun Ho Kim, Sang Sam Choi, Jungkeun Lee, Takeshi Kamiya, Seung Han Park

Department of Physics

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

A method to measure the low reflectivity of antireflection (AR)-coated electroabsorption (EA) waveguide facets by using the photocurrent is presented. The method is simple and efficient.

Original language	English
Pages (from-to)	500-501
Number of pages	2
Journal	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume	2
Publication status	Published - 2000

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Cite this

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title = "Facet reflectivity of antireflection-coated electroabsorption waveguide measured from photocurrent",

abstract = "A method to measure the low reflectivity of antireflection (AR)-coated electroabsorption (EA) waveguide facets by using the photocurrent is presented. The method is simple and efficient.",

author = "Kang, {Byung Kwon} and Park, {Yoon Ho} and Seok Lee and Kim, {Sun Ho} and Choi, {Sang Sam} and Jungkeun Lee and Takeshi Kamiya and Park, {Seung Han}",

year = "2000",

language = "English",

volume = "2",

pages = "500--501",

journal = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",

issn = "1092-8081",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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TY - JOUR

T1 - Facet reflectivity of antireflection-coated electroabsorption waveguide measured from photocurrent

AU - Kang, Byung Kwon

AU - Park, Yoon Ho

AU - Lee, Seok

AU - Kim, Sun Ho

AU - Choi, Sang Sam

AU - Lee, Jungkeun

AU - Kamiya, Takeshi

AU - Park, Seung Han

PY - 2000

Y1 - 2000

N2 - A method to measure the low reflectivity of antireflection (AR)-coated electroabsorption (EA) waveguide facets by using the photocurrent is presented. The method is simple and efficient.

AB - A method to measure the low reflectivity of antireflection (AR)-coated electroabsorption (EA) waveguide facets by using the photocurrent is presented. The method is simple and efficient.

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UR - http://www.scopus.com/inward/citedby.url?scp=0034482546&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0034482546

SN - 1092-8081

VL - 2

SP - 500

EP - 501

JO - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

JF - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

ER -

Facet reflectivity of antireflection-coated electroabsorption waveguide measured from photocurrent

Abstract

All Science Journal Classification (ASJC) codes

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