A method to measure the low reflectivity of antireflection (AR)-coated electroabsorption (EA) waveguide facets by using the photocurrent is presented. The method is simple and efficient.
|Number of pages||2|
|Journal||Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS|
|Publication status||Published - 2000 Jan 1|
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering