This work presents a facile identification method for the crystal orientations of graphene using the directional alignment between AgCN microwires and the underlying graphene. Because the microwires in the present work are visible with conventional optical microscopy, large-area graphene can be inspected with simple procedures. In the experimental study, we confirmed that the microwires can indicate graphene's crystal orientations with an acceptable accuracy as well as can be removed with a simple wet-etching process.
|Title of host publication||2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems, MEMS 2019|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Number of pages||2|
|Publication status||Published - 2019 Jan|
|Event||32nd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2019 - Seoul, Korea, Republic of|
Duration: 2019 Jan 27 → 2019 Jan 31
|Name||Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)|
|Conference||32nd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2019|
|Country/Territory||Korea, Republic of|
|Period||19/1/27 → 19/1/31|
Bibliographical noteFunding Information:
This work was supported by the Basic Science Research Program and the Convergence Technology Development Program for Bionic Arm through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (2018R1D1A1B07050575) and the Ministry of Science and ICT (2015M3C1B2052811).
© 2019 IEEE.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Mechanical Engineering
- Electrical and Electronic Engineering