Far field subwavelength focusing using optical eigenmodes

Jörg Baumgartl, Sebastian Kosmeier, Michael Mazilu, Edward T.F. Rogers, Nikolay I. Zheludev, Kishan Dholakia

Research output: Contribution to journalArticle

54 Citations (Scopus)

Abstract

We report the focusing of light to generate a subdiffractive, subwavelength focal spot of full width half maximum 222 nm at an operating wavelength of 633 nm using an optical eigenmode approach. Crucially, the spot is created in the focal plane of a microscope objective thus yielding a practical working distance for applications. The optical eigenmode approach is implemented using an optimal superposition of Bessel beams on a spatial light modulator. The effects of partial coherence are also discussed. This far field method is a key advance toward the generation of subdiffractive optical features for imaging and lithographic purposes.

Original languageEnglish
Article number181109
JournalApplied Physics Letters
Volume98
Issue number18
DOIs
Publication statusPublished - 2011 May 2

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light modulators
far fields
microscopes
wavelengths

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Baumgartl, J., Kosmeier, S., Mazilu, M., Rogers, E. T. F., Zheludev, N. I., & Dholakia, K. (2011). Far field subwavelength focusing using optical eigenmodes. Applied Physics Letters, 98(18), [181109]. https://doi.org/10.1063/1.3587636
Baumgartl, Jörg ; Kosmeier, Sebastian ; Mazilu, Michael ; Rogers, Edward T.F. ; Zheludev, Nikolay I. ; Dholakia, Kishan. / Far field subwavelength focusing using optical eigenmodes. In: Applied Physics Letters. 2011 ; Vol. 98, No. 18.
@article{d985b9c638b24dee8e8004e26bce366d,
title = "Far field subwavelength focusing using optical eigenmodes",
abstract = "We report the focusing of light to generate a subdiffractive, subwavelength focal spot of full width half maximum 222 nm at an operating wavelength of 633 nm using an optical eigenmode approach. Crucially, the spot is created in the focal plane of a microscope objective thus yielding a practical working distance for applications. The optical eigenmode approach is implemented using an optimal superposition of Bessel beams on a spatial light modulator. The effects of partial coherence are also discussed. This far field method is a key advance toward the generation of subdiffractive optical features for imaging and lithographic purposes.",
author = "J{\"o}rg Baumgartl and Sebastian Kosmeier and Michael Mazilu and Rogers, {Edward T.F.} and Zheludev, {Nikolay I.} and Kishan Dholakia",
year = "2011",
month = "5",
day = "2",
doi = "10.1063/1.3587636",
language = "English",
volume = "98",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "18",

}

Baumgartl, J, Kosmeier, S, Mazilu, M, Rogers, ETF, Zheludev, NI & Dholakia, K 2011, 'Far field subwavelength focusing using optical eigenmodes', Applied Physics Letters, vol. 98, no. 18, 181109. https://doi.org/10.1063/1.3587636

Far field subwavelength focusing using optical eigenmodes. / Baumgartl, Jörg; Kosmeier, Sebastian; Mazilu, Michael; Rogers, Edward T.F.; Zheludev, Nikolay I.; Dholakia, Kishan.

In: Applied Physics Letters, Vol. 98, No. 18, 181109, 02.05.2011.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Far field subwavelength focusing using optical eigenmodes

AU - Baumgartl, Jörg

AU - Kosmeier, Sebastian

AU - Mazilu, Michael

AU - Rogers, Edward T.F.

AU - Zheludev, Nikolay I.

AU - Dholakia, Kishan

PY - 2011/5/2

Y1 - 2011/5/2

N2 - We report the focusing of light to generate a subdiffractive, subwavelength focal spot of full width half maximum 222 nm at an operating wavelength of 633 nm using an optical eigenmode approach. Crucially, the spot is created in the focal plane of a microscope objective thus yielding a practical working distance for applications. The optical eigenmode approach is implemented using an optimal superposition of Bessel beams on a spatial light modulator. The effects of partial coherence are also discussed. This far field method is a key advance toward the generation of subdiffractive optical features for imaging and lithographic purposes.

AB - We report the focusing of light to generate a subdiffractive, subwavelength focal spot of full width half maximum 222 nm at an operating wavelength of 633 nm using an optical eigenmode approach. Crucially, the spot is created in the focal plane of a microscope objective thus yielding a practical working distance for applications. The optical eigenmode approach is implemented using an optimal superposition of Bessel beams on a spatial light modulator. The effects of partial coherence are also discussed. This far field method is a key advance toward the generation of subdiffractive optical features for imaging and lithographic purposes.

UR - http://www.scopus.com/inward/record.url?scp=79957440101&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79957440101&partnerID=8YFLogxK

U2 - 10.1063/1.3587636

DO - 10.1063/1.3587636

M3 - Article

AN - SCOPUS:79957440101

VL - 98

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 18

M1 - 181109

ER -

Baumgartl J, Kosmeier S, Mazilu M, Rogers ETF, Zheludev NI, Dholakia K. Far field subwavelength focusing using optical eigenmodes. Applied Physics Letters. 2011 May 2;98(18). 181109. https://doi.org/10.1063/1.3587636