Fast affine-invariant image matching based on global Bhattacharyya measure with adaptive tree

Jongin Son, Seungryong Kim, Kwanghoon Sohn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Establishing visual correspondence is one of the most fundamental tasks in many applications of computer vision fields. In this paper we propose a robust image matching to address the affine variation problems between two images taken under different viewpoints. Unlike the conventional approach finding the correspondence with local feature matching on fully affine transformed-images, which provides many outliers with a time consuming scheme, our approach is to find only one global correspondence and then utilizes the local feature matching to estimate the most reliable inliers between two images. In order to estimate a global image correspondence very fast as varying affine transformation in affine space of reference and query images, we employ a Bhattacharyya similarity measure between two images. Furthermore, an adaptive tree with affine transformation model is employed to dramatically reduce the computational complexity. Our approach represents the satisfactory results for severe affine transformed-images while providing a very low computational time. Experimental results show that the proposed affine-invariant image matching is twice faster than the state-of-the-art methods at least, and provides better correspondence performance under viewpoint change conditions.

Original languageEnglish
Title of host publication2015 IEEE International Conference on Image Processing, ICIP 2015 - Proceedings
PublisherIEEE Computer Society
Pages3190-3194
Number of pages5
ISBN (Electronic)9781479983391
DOIs
Publication statusPublished - 2015 Dec 9
EventIEEE International Conference on Image Processing, ICIP 2015 - Quebec City, Canada
Duration: 2015 Sep 272015 Sep 30

Publication series

NameProceedings - International Conference on Image Processing, ICIP
Volume2015-December
ISSN (Print)1522-4880

Other

OtherIEEE International Conference on Image Processing, ICIP 2015
CountryCanada
CityQuebec City
Period15/9/2715/9/30

All Science Journal Classification (ASJC) codes

  • Software
  • Computer Vision and Pattern Recognition
  • Signal Processing

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  • Cite this

    Son, J., Kim, S., & Sohn, K. (2015). Fast affine-invariant image matching based on global Bhattacharyya measure with adaptive tree. In 2015 IEEE International Conference on Image Processing, ICIP 2015 - Proceedings (pp. 3190-3194). [7351392] (Proceedings - International Conference on Image Processing, ICIP; Vol. 2015-December). IEEE Computer Society. https://doi.org/10.1109/ICIP.2015.7351392