FDTD characterization of waveguide-probe structures

Tentzeris Emmanouil, Michael Krumpholz, Nihad Dib, Jong Gwan Yook, Linda P.B. Katehi

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

The finite-difference time-domain (FDTD) technique is applied in the calculation of the S-parameters of diode mounting and waveguide-probe structures. The influence of the critical geometrical design parameters on the coupling of the coplanar feedline probe to the waveguide is investigated. A waveguide absorber based on analytic Green's functions is used to minimize the reflections over a wide band of frequencies.

Original languageEnglish
Pages (from-to)1452-1460
Number of pages9
JournalIEEE Transactions on Microwave Theory and Techniques
Volume46
Issue number10 PART 1
DOIs
Publication statusPublished - 1998 Dec 1

Fingerprint

Waveguides
waveguides
probes
analytic functions
Scattering parameters
mounting
Mountings
Green's function
absorbers
Diodes
Green's functions
diodes
broadband

All Science Journal Classification (ASJC) codes

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Emmanouil, Tentzeris ; Krumpholz, Michael ; Dib, Nihad ; Yook, Jong Gwan ; Katehi, Linda P.B. / FDTD characterization of waveguide-probe structures. In: IEEE Transactions on Microwave Theory and Techniques. 1998 ; Vol. 46, No. 10 PART 1. pp. 1452-1460.
@article{cec38a87b5254d3990b966db4a1979f3,
title = "FDTD characterization of waveguide-probe structures",
abstract = "The finite-difference time-domain (FDTD) technique is applied in the calculation of the S-parameters of diode mounting and waveguide-probe structures. The influence of the critical geometrical design parameters on the coupling of the coplanar feedline probe to the waveguide is investigated. A waveguide absorber based on analytic Green's functions is used to minimize the reflections over a wide band of frequencies.",
author = "Tentzeris Emmanouil and Michael Krumpholz and Nihad Dib and Yook, {Jong Gwan} and Katehi, {Linda P.B.}",
year = "1998",
month = "12",
day = "1",
doi = "10.1109/22.721147",
language = "English",
volume = "46",
pages = "1452--1460",
journal = "IEEE Transactions on Microwave Theory and Techniques",
issn = "0018-9480",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "10 PART 1",

}

Emmanouil, T, Krumpholz, M, Dib, N, Yook, JG & Katehi, LPB 1998, 'FDTD characterization of waveguide-probe structures', IEEE Transactions on Microwave Theory and Techniques, vol. 46, no. 10 PART 1, pp. 1452-1460. https://doi.org/10.1109/22.721147

FDTD characterization of waveguide-probe structures. / Emmanouil, Tentzeris; Krumpholz, Michael; Dib, Nihad; Yook, Jong Gwan; Katehi, Linda P.B.

In: IEEE Transactions on Microwave Theory and Techniques, Vol. 46, No. 10 PART 1, 01.12.1998, p. 1452-1460.

Research output: Contribution to journalArticle

TY - JOUR

T1 - FDTD characterization of waveguide-probe structures

AU - Emmanouil, Tentzeris

AU - Krumpholz, Michael

AU - Dib, Nihad

AU - Yook, Jong Gwan

AU - Katehi, Linda P.B.

PY - 1998/12/1

Y1 - 1998/12/1

N2 - The finite-difference time-domain (FDTD) technique is applied in the calculation of the S-parameters of diode mounting and waveguide-probe structures. The influence of the critical geometrical design parameters on the coupling of the coplanar feedline probe to the waveguide is investigated. A waveguide absorber based on analytic Green's functions is used to minimize the reflections over a wide band of frequencies.

AB - The finite-difference time-domain (FDTD) technique is applied in the calculation of the S-parameters of diode mounting and waveguide-probe structures. The influence of the critical geometrical design parameters on the coupling of the coplanar feedline probe to the waveguide is investigated. A waveguide absorber based on analytic Green's functions is used to minimize the reflections over a wide band of frequencies.

UR - http://www.scopus.com/inward/record.url?scp=0000759852&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0000759852&partnerID=8YFLogxK

U2 - 10.1109/22.721147

DO - 10.1109/22.721147

M3 - Article

AN - SCOPUS:0000759852

VL - 46

SP - 1452

EP - 1460

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

SN - 0018-9480

IS - 10 PART 1

ER -