FDTD characterization of waveguide-probe structures

Tentzeris Emmanouil, Michael Krumpholz, Nihad Dib, Jong Gwan Yook, Linda P.B. Katehi

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Abstract

The finite-difference time-domain (FDTD) technique is applied in the calculation of the S-parameters of diode mounting and waveguide-probe structures. The influence of the critical geometrical design parameters on the coupling of the coplanar feedline probe to the waveguide is investigated. A waveguide absorber based on analytic Green's functions is used to minimize the reflections over a wide band of frequencies.

Original languageEnglish
Pages (from-to)1452-1460
Number of pages9
JournalIEEE Transactions on Microwave Theory and Techniques
Volume46
Issue number10 PART 1
DOIs
Publication statusPublished - 1998 Dec 1

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All Science Journal Classification (ASJC) codes

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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