Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology

Woohyun Jung, Jongki Kim, Hang Eun Joe, Byung Kwon Min, Kyunghwan Oh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We proposed a compact and simple photoluminescence measurement system based on fiber-optic probes that can be scanned over a wide area with a high spatial resolution. We applied the system in morphological study of GaN epitaxial layers for LED applications.

Original languageEnglish
Title of host publication2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013
DOIs
Publication statusPublished - 2013 Oct 18
Event10th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013 - Kyoto, Japan
Duration: 2013 Jun 302013 Jul 4

Publication series

NamePacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest

Other

Other10th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013
CountryJapan
CityKyoto
Period13/6/3013/7/4

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Jung, W., Kim, J., Joe, H. E., Min, B. K., & Oh, K. (2013). Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology. In 2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013 [6600385] (Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest). https://doi.org/10.1109/CLEOPR.2013.6600385