Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology

Woohyun Jung, Jongki Kim, Hang Eun Joe, Byung-Kwon Min, Kyunghwan Oh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We proposed a compact and simple photoluminescence measurement system based on fiber-optic probes that can be scanned over a wide area with a high spatial resolution. We applied the system in morphological study of GaN epitaxial layers for LED applications.

Original languageEnglish
Title of host publication2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013
DOIs
Publication statusPublished - 2013 Oct 18
Event10th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013 - Kyoto, Japan
Duration: 2013 Jun 302013 Jul 4

Other

Other10th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013
CountryJapan
CityKyoto
Period13/6/3013/7/4

Fingerprint

Epitaxial layers
Fiber optics
Light emitting diodes
fiber optics
Photoluminescence
light emitting diodes
spatial resolution
wafers
photoluminescence
evaluation
probes
high resolution

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Jung, W., Kim, J., Joe, H. E., Min, B-K., & Oh, K. (2013). Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology. In 2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013 [6600385] https://doi.org/10.1109/CLEOPR.2013.6600385
Jung, Woohyun ; Kim, Jongki ; Joe, Hang Eun ; Min, Byung-Kwon ; Oh, Kyunghwan. / Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology. 2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013. 2013.
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abstract = "We proposed a compact and simple photoluminescence measurement system based on fiber-optic probes that can be scanned over a wide area with a high spatial resolution. We applied the system in morphological study of GaN epitaxial layers for LED applications.",
author = "Woohyun Jung and Jongki Kim and Joe, {Hang Eun} and Byung-Kwon Min and Kyunghwan Oh",
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Jung, W, Kim, J, Joe, HE, Min, B-K & Oh, K 2013, Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology. in 2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013., 6600385, 10th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013, Kyoto, Japan, 13/6/30. https://doi.org/10.1109/CLEOPR.2013.6600385

Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology. / Jung, Woohyun; Kim, Jongki; Joe, Hang Eun; Min, Byung-Kwon; Oh, Kyunghwan.

2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013. 2013. 6600385.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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T1 - Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology

AU - Jung, Woohyun

AU - Kim, Jongki

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AU - Min, Byung-Kwon

AU - Oh, Kyunghwan

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Jung W, Kim J, Joe HE, Min B-K, Oh K. Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology. In 2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013. 2013. 6600385 https://doi.org/10.1109/CLEOPR.2013.6600385