Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology

Woohyun Jung; Jongki Kim; Hang Eun Joe; Byung Kwon Min; Kyunghwan Oh

doi:10.1109/CLEOPR.2013.6600385

Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology

Woohyun Jung, Jongki Kim, Hang Eun Joe, Byung Kwon Min, Kyunghwan Oh

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We proposed a compact and simple photoluminescence measurement system based on fiber-optic probes that can be scanned over a wide area with a high spatial resolution. We applied the system in morphological study of GaN epitaxial layers for LED applications.

Original language	English
Title of host publication	2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013
DOIs	https://doi.org/10.1109/CLEOPR.2013.6600385
Publication status	Published - 2013
Event	10th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013 - Kyoto, Japan Duration: 2013 Jun 30 → 2013 Jul 4

Publication series

Name	Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest

Other

Other	10th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013
Country/Territory	Japan
City	Kyoto
Period	13/6/30 → 13/7/4

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/CLEOPR.2013.6600385

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Jung, W., Kim, J., Joe, H. E., Min, B. K., & Oh, K. (2013). Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology. In 2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013 [6600385] (Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest). https://doi.org/10.1109/CLEOPR.2013.6600385

@inproceedings{823123dc3817496bae39c2133b7182cd,

title = "Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology",

abstract = "We proposed a compact and simple photoluminescence measurement system based on fiber-optic probes that can be scanned over a wide area with a high spatial resolution. We applied the system in morphological study of GaN epitaxial layers for LED applications.",

author = "Woohyun Jung and Jongki Kim and Joe, {Hang Eun} and Min, {Byung Kwon} and Kyunghwan Oh",

year = "2013",

doi = "10.1109/CLEOPR.2013.6600385",

language = "English",

isbn = "9781467364751",

series = "Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest",

booktitle = "2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013",

note = "10th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013 ; Conference date: 30-06-2013 Through 04-07-2013",

}

Jung, W, Kim, J, Joe, HE, Min, BK & Oh, K 2013, Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology. in 2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013., 6600385, Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest, 10th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013, Kyoto, Japan, 13/6/30. https://doi.org/10.1109/CLEOPR.2013.6600385

Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology. / Jung, Woohyun; Kim, Jongki; Joe, Hang Eun et al.

2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013. 2013. 6600385 (Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology

AU - Jung, Woohyun

AU - Kim, Jongki

AU - Joe, Hang Eun

AU - Min, Byung Kwon

AU - Oh, Kyunghwan

PY - 2013

Y1 - 2013

N2 - We proposed a compact and simple photoluminescence measurement system based on fiber-optic probes that can be scanned over a wide area with a high spatial resolution. We applied the system in morphological study of GaN epitaxial layers for LED applications.

AB - We proposed a compact and simple photoluminescence measurement system based on fiber-optic probes that can be scanned over a wide area with a high spatial resolution. We applied the system in morphological study of GaN epitaxial layers for LED applications.

UR - http://www.scopus.com/inward/record.url?scp=84885457621&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84885457621&partnerID=8YFLogxK

U2 - 10.1109/CLEOPR.2013.6600385

DO - 10.1109/CLEOPR.2013.6600385

M3 - Conference contribution

AN - SCOPUS:84885457621

SN - 9781467364751

T3 - Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest

BT - 2013 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013

T2 - 10th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2013

Y2 - 30 June 2013 through 4 July 2013

ER -

Fiber-optic photoluminescence measurement system for evaluation of InGaN/GaN LED epi-wafer morphology

Abstract

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All Science Journal Classification (ASJC) codes

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