Field-based dynamic light scattering microscopy: Theory and numerical analysis

Chulmin Joo, Johannes F. De Boer

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

We present a theoretical framework for field-based dynamic light scattering microscopy based on a spectral-domain optical coherence phase microscopy (SD-OCPM) platform. SD-OCPM is an interferometric microscope capable of quantitative measurement of amplitude and phase of scattered light with high phase stability. Field-based dynamic light scattering (F-DLS) analysis allows for direct evaluation of complex-valued field autocorrelation function and measurement of localized diffusive and directional dynamic properties of biological and material samples with high spatial resolution. In order to gain insight into the information provided by F-DLS microscopy, theoretical and numerical analyses are performed to evaluate the effect of numerical aperture of the imaging optics.We demonstrate that sharp focusing of fields affects the measured diffusive and transport velocity, which leads to smaller values for the dynamic properties in the sample. An approach for accurately determining the dynamic properties of the samples is discussed.

Original languageEnglish
Pages (from-to)7618-7628
Number of pages11
JournalApplied Optics
Volume52
Issue number31
DOIs
Publication statusPublished - 2013 Nov 1

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Dynamic light scattering
numerical analysis
Numerical analysis
Microscopic examination
light scattering
dynamic characteristics
microscopy
phase coherence
Phase stability
numerical aperture
Autocorrelation
autocorrelation
Optics
Microscopes
platforms
spatial resolution
microscopes
optics
Imaging techniques
evaluation

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

Cite this

Joo, Chulmin ; De Boer, Johannes F. / Field-based dynamic light scattering microscopy : Theory and numerical analysis. In: Applied Optics. 2013 ; Vol. 52, No. 31. pp. 7618-7628.
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Field-based dynamic light scattering microscopy : Theory and numerical analysis. / Joo, Chulmin; De Boer, Johannes F.

In: Applied Optics, Vol. 52, No. 31, 01.11.2013, p. 7618-7628.

Research output: Contribution to journalArticle

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