Flatband voltage instability characteristics of HfO2 -based GaAs metal-oxide-semiconductor capacitors with a thin Ge layer

Hyoung Sub Kim, I. Ok, M. Zhang, F. Zhu, S. Park, J. Yum, H. Zhao, Jack C. Lee, Jungwoo Oh, Prashant Majhi

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12 Citations (Scopus)

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Physics & Astronomy