Fourier ptychographic microscopy for extended focus range with conjugated optics

Jinsang Lim, Guk Jong Choi, Hyun Choi, No Cheol Park

Research output: Contribution to journalArticle

Abstract

We propose a configuration of Fourier ptychographic microscopy (FPM) to modulate the focus to a large extent. FPM is widely used to obtain high-resolution images in a wide field of view. A conjugation mirror with an axially scannable mirror is introduced to conventional FPM to extend the focus range. The proposed FPM provides a wider field of view with higher resolution compared to general microscopy using the same numerical aperture. In addition, it can measure a wider focus range. Therefore, it is expected to be applied to volumetric samples more easily compared to FPM. The proposed technique is validated by measuring resolution while moving the United States Air Force resolution chart up to ± 2 mm in the axial direction and experimentally verified by measuring a volumetric sample with a depth of 4 mm created using bead with 1 μm of diameter.

Original languageEnglish
Article number106080
JournalOptics and Lasers in Engineering
Volume129
DOIs
Publication statusPublished - 2020 Jun

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Mechanical Engineering
  • Electrical and Electronic Engineering

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