Fully Deep Blind Image Quality Predictor

Jongyoo Kim, Sanghoon Lee

Research output: Contribution to journalArticle

139 Citations (Scopus)

Abstract

In general, owing to the benefits obtained from original information, full-reference image quality assessment (FR-IQA) achieves relatively higher prediction accuracy than no-reference image quality assessment (NR-IQA). By fully utilizing reference images, conventional FR-IQA methods have been investigated to produce objective scores that are close to subjective scores. In contrast, NR-IQA does not consider reference images; thus, its performance is inferior to that of FR-IQA. To alleviate this accuracy discrepancy between FR-IQA and NR-IQA methods, we propose a blind image evaluator based on a convolutional neural network (BIECON). To imitate FR-IQA behavior, we adopt the strong representation power of a deep convolutional neural network to generate a local quality map, similar to FR-IQA. To obtain the best results from the deep neural network, replacing hand-crafted features with automatically learned features is necessary. To apply the deep model to the NR-IQA framework, three critical problems must be resolved: 1) lack of training data; 2) absence of local ground truth targets; and 3) different purposes of feature learning. BIECON follows the FR-IQA behavior using the local quality maps as intermediate targets for conventional neural networks, which leads to NR-IQA prediction accuracy that is comparable with that of state-of-the-art FR-IQA methods.

Original languageEnglish
Article number7782419
Pages (from-to)206-220
Number of pages15
JournalIEEE Journal on Selected Topics in Signal Processing
Volume11
Issue number1
DOIs
Publication statusPublished - 2017 Feb

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Electrical and Electronic Engineering

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