Fundamental investigation of micro wear rate using an atomic force microscope

Koo Hyun Chung, Dae Eun Kim

Research output: Contribution to journalArticle

75 Citations (Scopus)

Abstract

Micro-wear characteristics of Si and Si3N4 tips and the surfaces of Au, Cu, DLC, and bare Si were investigated using an Atomic Force Microscope (AFM). The range of applied load was between 10 to 800 nN. It was found that the wear coefficient values were between 10-3 to 10-1 and 10-5 to 10-4 for Si and Si 3N4 tip, respectively. The experimentally obtained wear rates were comparable to those of the macro-scale systems. Also, evidence of micro-plastic deformation could be found on the wear track.

Original languageEnglish
Pages (from-to)135-144
Number of pages10
JournalTribology Letters
Volume15
Issue number2
DOIs
Publication statusPublished - 2003 Aug 1

Fingerprint

Microscopes
microscopes
Wear of materials
plastic deformation
Macros
Plastic deformation
coefficients

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Mechanical Engineering
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

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Fundamental investigation of micro wear rate using an atomic force microscope. / Chung, Koo Hyun; Kim, Dae Eun.

In: Tribology Letters, Vol. 15, No. 2, 01.08.2003, p. 135-144.

Research output: Contribution to journalArticle

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