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Gate capacitance-dependent field-effect mobility in solution-processed oxide semiconductor thin-film transistors
Eungkyu Lee, Jieun Ko, Keon Hee Lim, Kyongjun Kim, Si Yun Park, Jae M. Myoung, Youn Sang Kim
Research output: Contribution to journal › Article › peer-review
81
Citations
(Scopus)