TY - GEN
T1 - Gaussian process regression using Laplace approximations under localization uncertainty
AU - Jadaliha, Mahdi
AU - Xu, Yunfei
AU - Choi, Jongeun
PY - 2012
Y1 - 2012
N2 - In this paper, we formulate Gaussian process regression with observations under the localization uncertainty. In our formulation, effects of observations, measurement noise, localization uncertainty and prior distributions are all correctly incorporated in the posterior predictive statistics. The analytically intractable posterior predictive statistics are proposed to be approximated by Laplace approximations in different degrees of complexity. Such approximations have been carefully tailored to our problems and their approximation errors and complexity are analyzed. Simulation results demonstrate that the proposed approaches perform much better than approaches without considering the localization uncertainty correctly.
AB - In this paper, we formulate Gaussian process regression with observations under the localization uncertainty. In our formulation, effects of observations, measurement noise, localization uncertainty and prior distributions are all correctly incorporated in the posterior predictive statistics. The analytically intractable posterior predictive statistics are proposed to be approximated by Laplace approximations in different degrees of complexity. Such approximations have been carefully tailored to our problems and their approximation errors and complexity are analyzed. Simulation results demonstrate that the proposed approaches perform much better than approaches without considering the localization uncertainty correctly.
UR - http://www.scopus.com/inward/record.url?scp=84869440926&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84869440926&partnerID=8YFLogxK
U2 - 10.1109/acc.2012.6314793
DO - 10.1109/acc.2012.6314793
M3 - Conference contribution
AN - SCOPUS:84869440926
SN - 9781457710957
T3 - Proceedings of the American Control Conference
SP - 1394
EP - 1399
BT - 2012 American Control Conference, ACC 2012
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2012 American Control Conference, ACC 2012
Y2 - 27 June 2012 through 29 June 2012
ER -