Generalized adaptive edge-preserving image restoration algorithm

Sung Cheol Park, Moon Gi Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Discontinuities present serious difficulties to standard regularization, since standard regularization theory imposes global smoothness constraints on possible solution. We propose a noise-adaptive edge-preserving image restoration algorithm based on the Markov random field image model. Our potential function is controlled by the weighting function for providing the capability of adaptively introducing the discontinuities into the solution. Moreover a new parameter is adopted to prevent the undesirable amplification of strong noise. Extending our previous work, we propose a nonlinear formulation of the regularization functional and derive an iterative algorithm for ensuring the global minimum. The effectiveness of the proposed algorithm is demonstrated experimentally.

Original languageEnglish
Title of host publicationIEEE Region 10 Annual International Conference, Proceedings/TENCON
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages726-729
Number of pages4
ISBN (Electronic)0780357396, 9780780357396
DOIs
Publication statusPublished - 1999 Jan 1
Event1999 IEEE Region 10 Conference, TENCON 1999 - Cheju Island, Korea, Republic of
Duration: 1999 Sep 151999 Sep 17

Publication series

NameIEEE Region 10 Annual International Conference, Proceedings/TENCON
Volume1
ISSN (Print)2159-3442
ISSN (Electronic)2159-3450

Other

Other1999 IEEE Region 10 Conference, TENCON 1999
CountryKorea, Republic of
CityCheju Island
Period99/9/1599/9/17

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All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Park, S. C., & Kang, M. G. (1999). Generalized adaptive edge-preserving image restoration algorithm. In IEEE Region 10 Annual International Conference, Proceedings/TENCON (pp. 726-729). (IEEE Region 10 Annual International Conference, Proceedings/TENCON; Vol. 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TENCON.1999.818517