Genetic algorithms applied to optimal tolerance levels of multiattribute inspection errors

So Young Sohn, Hyoung Uk Moon

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

In modern manufacturing environment, inspection equipment often can deal with more than one quality characteristic simultaneously. At the design stage of such inspection equipment, it is necessary to identify optimal combination of inspection error tolerance levels of multiattributes. We suggest a genetic algorithm by which one can determine the optimal tolerance levels of errors for multiinspection attributes at a minimum cost of ownership (COO). The COO model is formulated as a function of not only the initial purchase cost but also the inspection cost over lifetime. Our approach is expected to effectively contribute to marketing as well as manufacturing of inspection equipment.

Original languageEnglish
Pages (from-to)338-344
Number of pages7
JournalIEEE Transactions on Electronics Packaging Manufacturing
Volume26
Issue number4
DOIs
Publication statusPublished - 2003 Oct 1

Fingerprint

Inspection equipment
Genetic algorithms
Inspection
Costs
Marketing

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Cite this

@article{53346f5198454cbb98c999f54c46f83b,
title = "Genetic algorithms applied to optimal tolerance levels of multiattribute inspection errors",
abstract = "In modern manufacturing environment, inspection equipment often can deal with more than one quality characteristic simultaneously. At the design stage of such inspection equipment, it is necessary to identify optimal combination of inspection error tolerance levels of multiattributes. We suggest a genetic algorithm by which one can determine the optimal tolerance levels of errors for multiinspection attributes at a minimum cost of ownership (COO). The COO model is formulated as a function of not only the initial purchase cost but also the inspection cost over lifetime. Our approach is expected to effectively contribute to marketing as well as manufacturing of inspection equipment.",
author = "Sohn, {So Young} and Moon, {Hyoung Uk}",
year = "2003",
month = "10",
day = "1",
doi = "10.1109/TEPM.2003.822081",
language = "English",
volume = "26",
pages = "338--344",
journal = "IEEE Transactions on Electronics Packaging Manufacturing",
issn = "1521-334X",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "4",

}

Genetic algorithms applied to optimal tolerance levels of multiattribute inspection errors. / Sohn, So Young; Moon, Hyoung Uk.

In: IEEE Transactions on Electronics Packaging Manufacturing, Vol. 26, No. 4, 01.10.2003, p. 338-344.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Genetic algorithms applied to optimal tolerance levels of multiattribute inspection errors

AU - Sohn, So Young

AU - Moon, Hyoung Uk

PY - 2003/10/1

Y1 - 2003/10/1

N2 - In modern manufacturing environment, inspection equipment often can deal with more than one quality characteristic simultaneously. At the design stage of such inspection equipment, it is necessary to identify optimal combination of inspection error tolerance levels of multiattributes. We suggest a genetic algorithm by which one can determine the optimal tolerance levels of errors for multiinspection attributes at a minimum cost of ownership (COO). The COO model is formulated as a function of not only the initial purchase cost but also the inspection cost over lifetime. Our approach is expected to effectively contribute to marketing as well as manufacturing of inspection equipment.

AB - In modern manufacturing environment, inspection equipment often can deal with more than one quality characteristic simultaneously. At the design stage of such inspection equipment, it is necessary to identify optimal combination of inspection error tolerance levels of multiattributes. We suggest a genetic algorithm by which one can determine the optimal tolerance levels of errors for multiinspection attributes at a minimum cost of ownership (COO). The COO model is formulated as a function of not only the initial purchase cost but also the inspection cost over lifetime. Our approach is expected to effectively contribute to marketing as well as manufacturing of inspection equipment.

UR - http://www.scopus.com/inward/record.url?scp=1242286447&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=1242286447&partnerID=8YFLogxK

U2 - 10.1109/TEPM.2003.822081

DO - 10.1109/TEPM.2003.822081

M3 - Article

AN - SCOPUS:1242286447

VL - 26

SP - 338

EP - 344

JO - IEEE Transactions on Electronics Packaging Manufacturing

JF - IEEE Transactions on Electronics Packaging Manufacturing

SN - 1521-334X

IS - 4

ER -