Genetic algorithms applied to optimal tolerance levels of multiattribute inspection errors

So Young Sohn, Hyoung Uk Moon

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

In modern manufacturing environment, inspection equipment often can deal with more than one quality characteristic simultaneously. At the design stage of such inspection equipment, it is necessary to identify optimal combination of inspection error tolerance levels of multiattributes. We suggest a genetic algorithm by which one can determine the optimal tolerance levels of errors for multiinspection attributes at a minimum cost of ownership (COO). The COO model is formulated as a function of not only the initial purchase cost but also the inspection cost over lifetime. Our approach is expected to effectively contribute to marketing as well as manufacturing of inspection equipment.

Original languageEnglish
Pages (from-to)338-344
Number of pages7
JournalIEEE Transactions on Electronics Packaging Manufacturing
Volume26
Issue number4
DOIs
Publication statusPublished - 2003 Oct

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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