Global template projection and matching method for training-free analysis of delayered IC images

Deruo Cheng, Yiqiong Shi, Tong Lin, Bah Hwee Gwee, Kar Ann Toh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Pattern recognition algorithms have recently been pursued for automatic analysis of delayered IC images, i.e. the detection of circuit components. Wide experimentation on the existing training-based approaches are hampered by heavy data labeling, expensive model training, or long processing time. In this paper, we propose a global template projection and matching (GTPM) method that requires no training and a minimal amount of data labeling for circuit component detection. Our proposed GTPM method achieves a higher or comparable accuracy as the reported approaches while being more computationally efficient.

Original languageEnglish
Title of host publication2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728103976
DOIs
Publication statusPublished - 2019
Event2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Sapporo, Japan
Duration: 2019 May 262019 May 29

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume2019-May
ISSN (Print)0271-4310

Conference

Conference2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019
CountryJapan
CitySapporo
Period19/5/2619/5/29

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Global template projection and matching method for training-free analysis of delayered IC images'. Together they form a unique fingerprint.

Cite this