Grain boundary mapping in polycrystalline graphene

Kwanpyo Kim, Zonghoon Lee, William Regan, C. Kisielowski, M. F. Crommie, A. Zettl

Research output: Contribution to journalArticle

461 Citations (Scopus)

Abstract

We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon-heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies.

Original languageEnglish
Pages (from-to)2142-2146
Number of pages5
JournalACS Nano
Volume5
Issue number3
DOIs
Publication statusPublished - 2011 Mar 22

Fingerprint

Graphite
Graphene
graphene
Grain boundaries
grain boundaries
Transmission electron microscopy
transmission electron microscopy
Aberrations
Electron diffraction
micrometers
aberration
Monolayers
electron diffraction
Imaging techniques
Atoms
Scanning electron microscopy
scanning electron microscopy
atoms

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Materials Science(all)
  • Physics and Astronomy(all)

Cite this

Kim, K., Lee, Z., Regan, W., Kisielowski, C., Crommie, M. F., & Zettl, A. (2011). Grain boundary mapping in polycrystalline graphene. ACS Nano, 5(3), 2142-2146. https://doi.org/10.1021/nn1033423
Kim, Kwanpyo ; Lee, Zonghoon ; Regan, William ; Kisielowski, C. ; Crommie, M. F. ; Zettl, A. / Grain boundary mapping in polycrystalline graphene. In: ACS Nano. 2011 ; Vol. 5, No. 3. pp. 2142-2146.
@article{a2282fa7d12149ec9d02c9014863bb96,
title = "Grain boundary mapping in polycrystalline graphene",
abstract = "We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon-heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies.",
author = "Kwanpyo Kim and Zonghoon Lee and William Regan and C. Kisielowski and Crommie, {M. F.} and A. Zettl",
year = "2011",
month = "3",
day = "22",
doi = "10.1021/nn1033423",
language = "English",
volume = "5",
pages = "2142--2146",
journal = "ACS Nano",
issn = "1936-0851",
publisher = "American Chemical Society",
number = "3",

}

Kim, K, Lee, Z, Regan, W, Kisielowski, C, Crommie, MF & Zettl, A 2011, 'Grain boundary mapping in polycrystalline graphene', ACS Nano, vol. 5, no. 3, pp. 2142-2146. https://doi.org/10.1021/nn1033423

Grain boundary mapping in polycrystalline graphene. / Kim, Kwanpyo; Lee, Zonghoon; Regan, William; Kisielowski, C.; Crommie, M. F.; Zettl, A.

In: ACS Nano, Vol. 5, No. 3, 22.03.2011, p. 2142-2146.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Grain boundary mapping in polycrystalline graphene

AU - Kim, Kwanpyo

AU - Lee, Zonghoon

AU - Regan, William

AU - Kisielowski, C.

AU - Crommie, M. F.

AU - Zettl, A.

PY - 2011/3/22

Y1 - 2011/3/22

N2 - We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon-heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies.

AB - We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon-heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies.

UR - http://www.scopus.com/inward/record.url?scp=79952936581&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79952936581&partnerID=8YFLogxK

U2 - 10.1021/nn1033423

DO - 10.1021/nn1033423

M3 - Article

C2 - 21280616

AN - SCOPUS:79952936581

VL - 5

SP - 2142

EP - 2146

JO - ACS Nano

JF - ACS Nano

SN - 1936-0851

IS - 3

ER -

Kim K, Lee Z, Regan W, Kisielowski C, Crommie MF, Zettl A. Grain boundary mapping in polycrystalline graphene. ACS Nano. 2011 Mar 22;5(3):2142-2146. https://doi.org/10.1021/nn1033423