Grain boundary mapping in polycrystalline graphene

Kwanpyo Kim, Zonghoon Lee, William Regan, C. Kisielowski, M. F. Crommie, A. Zettl

Research output: Contribution to journalArticle

475 Citations (Scopus)


We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon-heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies.

Original languageEnglish
Pages (from-to)2142-2146
Number of pages5
JournalACS Nano
Issue number3
Publication statusPublished - 2011 Mar 22

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Engineering(all)
  • Physics and Astronomy(all)

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    Kim, K., Lee, Z., Regan, W., Kisielowski, C., Crommie, M. F., & Zettl, A. (2011). Grain boundary mapping in polycrystalline graphene. ACS Nano, 5(3), 2142-2146.