Grain boundary mapping in polycrystalline graphene

Kwanpyo Kim, Zonghoon Lee, William Regan, C. Kisielowski, M. F. Crommie, A. Zettl

Research output: Contribution to journalArticlepeer-review

484 Citations (Scopus)

Abstract

We report direct mapping of the grains and grain boundaries (GBs) of large-area monolayer polycrystalline graphene sheets, at large (several micrometer) and single-atom length scales. Global grain and GB mapping is performed using electron diffraction in scanning transmission electron microscopy (STEM) or using dark-field imaging in conventional TEM. Additionally, we employ aberration-corrected TEM to extract direct images of the local atomic arrangements of graphene GBs, which reveal the alternating pentagon-heptagon structure along high-angle GBs. Our findings provide a readily adaptable tool for graphene GB studies.

Original languageEnglish
Pages (from-to)2142-2146
Number of pages5
JournalACS Nano
Volume5
Issue number3
DOIs
Publication statusPublished - 2011 Mar 22

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Engineering(all)
  • Physics and Astronomy(all)

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