Grouped scan slice repetition method for reducing test data volume and test application time

Yongjoon Kim, Yung Hoon Yangm, Jaeseok Park, Eunsei Park, Sungho Kang

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

This paper presents a grouped scan slice encoding technique using scan slice repetition to simultaneously reduce test data volume and test application time. Using this method, many scan slices that would be incompatible with the conventional selective scan slice method can be encoded as compatible scan slices. Experiments were performed with ISCAS' 89 and ITC'99 benchmark circuits, and results show the effectiveness of the proposed method.

Original languageEnglish
Pages (from-to)1462-1465
Number of pages4
JournalIEICE Transactions on Information and Systems
VolumeE92-D
Issue number7
DOIs
Publication statusPublished - 2009 Jan 1

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Experiments

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering
  • Artificial Intelligence

Cite this

Kim, Yongjoon ; Yangm, Yung Hoon ; Park, Jaeseok ; Park, Eunsei ; Kang, Sungho. / Grouped scan slice repetition method for reducing test data volume and test application time. In: IEICE Transactions on Information and Systems. 2009 ; Vol. E92-D, No. 7. pp. 1462-1465.
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Grouped scan slice repetition method for reducing test data volume and test application time. / Kim, Yongjoon; Yangm, Yung Hoon; Park, Jaeseok; Park, Eunsei; Kang, Sungho.

In: IEICE Transactions on Information and Systems, Vol. E92-D, No. 7, 01.01.2009, p. 1462-1465.

Research output: Contribution to journalArticle

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