Growth and characterization of MOMBE grown HfO 2

Tae Hyoung Moon, Moon Ho Ham, Myoung Seok Kim, Ilgu Yun, Jae Min Myoung

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31 Citations (Scopus)

Abstract

HfO 2 dielectric layers were grown directly on the p-type Si (1 0 0) by metalorganic molecular beam epitaxy (MOMBE). Hafnium tetra-butoxide was used as a Hf precursor and pure oxygen was introduced to form an oxide layer. The properties of the layers with different thicknesses were evaluated by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), high-resolution transmission electron microscopy (HRTEM), and capacitance-voltage (C-V) and current-voltage (I-V) analyses. XRD and HRTEM results showed that the HfO 2 films thinner than 12 nm were amorphous while the films thicker than 12 nm began to crystallize in the tetragonal and the monoclinic phases. The XPS spectra of O 1s show that the O-Si binding energies shifted to the lower binding energy with increasing the HfO 2 layer thickness. Moreover, the snap back phenomenon is observed in accumulation capacitance. These changes are believed to be linked with the decomposition of SiO and the crystallization of HfO 2 layer during the film growth.

Original languageEnglish
Pages (from-to)105-111
Number of pages7
JournalApplied Surface Science
Volume240
Issue number1-4
DOIs
Publication statusPublished - 2005 Feb 15

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All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

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