Abstract
Growth and physical properties of epitaxial CeN layers on MgO were investigated. The films were grown by ultrahigh vacuum reactive magnetron sputter deposition. X-ray diffraction and transmission electron microscopy were used for the analysis. The hardness and elastic modulus of CeN were determined from nanoindentation measurements.
Original language | English |
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Pages (from-to) | 921-927 |
Number of pages | 7 |
Journal | Journal of Applied Physics |
Volume | 94 |
Issue number | 2 |
DOIs | |
Publication status | Published - 2003 Jul 15 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)