Heterostructural characterization of pseudomorphic, partially strained, and highly mismatched semiconductors using double crystal x-ray diffraction, TEM, and SEM

Hyung Mun Kim, Sang Gi Kim, Sahn Nahm, Hyung Ho Park, Hae Kwon Lee, Jae Jin Lee, Kyung Ik Cho, Heung Ro Choo, Hong Man Kim, Hyung Moo Park, Sin Chong Park

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