High-efficiency BIRA for embedded memories with a high repair rate and low area overhead

Joohwan Lee, Kihyun Park, Sungho Kang

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

High-efficiency built-in redundancy analysis (BIRA) is presented. The proposed BIRA uses three techniques to achieve a high repair rate using spare mapping registers with adjustable fault tags to reduce area overhead. Simulation results show that the proposed BIRA is a reasonable solution for embedded memories.

Original languageEnglish
Pages (from-to)266-269
Number of pages4
JournalJournal of Semiconductor Technology and Science
Volume12
Issue number3
DOIs
Publication statusPublished - 2012 Sep 1

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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